ZEISS GeminiSEM FE-SEM

Image carbon nanostructures, engineeredand self organized nanosystems, and nanocomposite materials at high resolution. The GeminiSEM 500 Nano-twin lens lets you image beam-sensitive, nanoscalestructures with minute detail at low beam energy. The efficient detection allows you to operate at low currents for minimum beam damage, while enjoying excellent materials contrasts.

Understand the aging process of batteries. GeminiSEM 500 enables comprehensive characterization for battery development on one system. Thanks to its low voltage and low current imaging capabilities, you can observe sensitive binder and separator materials free of damage. At the same time full analytical capabilities are available for compositional analysis of electrode materials.

Perform semiconductor failure analysis using GeminiSEM. With its Nano-twin lens, GeminiSEM 500 enables rapid, reliable and damage-freecharacterization of nanoscale defects and sensitive resist structures at low beamenergies.

The combination of high performance, high resolution imaging and variablepressure capabilities of up to 500 Pa makes the GeminiSEM family the ideal choicefor maximum sample flexibility. With a wide range of options, application-specificmodules and workflows, you can satisfy a growing range of application requirementson a single system, now and in the future.

Investigate sub-cellular ultrastructure with high resolution transmission images of resin embedded cellular ultrastructure, with optimum contrast and minimal sample damage.

Achieve high throughput mapping of large volumes or areas of cellular tissue. Choose from application specific modules for array tomography, 3View in chamber microtomy and correlative microscopy.