Microscopy Events

ZEISS at the Materials Science & Technology Show

October 9-11, 2017 - Pittsburg, PA, USA, booth #400

Stop by our booth at MS&T 2017 to see our wide array of microscope products. Come immerse yourself in our solutions to your technical applications live in our booth or speak with a ZEISS expert to help you establish the best solutions to fit your needs.


With ZEISS GeminiSEM 500 you can get sub-nanometer resolution and high detection efficiency, even in variable pressure mode. GeminiSEM combines proven Gemini technology with a novel electron optical design. Achieve better resolution, especially at low voltage. With 20 times greater Inlens detection signal, you will always acquire crisp images fast and with minimum sample damage.  

ZEISS Axio Observer

The ZEISS Axio Observer is the go to inverted metallographic microscope for investigation, development and analysis of materials. You can count on the quality of ZEISS optics for reliability and brilliant images. As an open imaging platform you can invest in the features you need currently and upgrade your instrument when you need it.

ZEISS Smartzoom 5

ZEISS Smartzoom5 is your digital microscope for the non-microscopist. With “google earth” like navigation and guided workflows results are quick and reliable. Whether you are taking 2D or 3D micro-measurements, routine inspecting or documenting component failures you can count on quality imaging with an integrated system approach.

ZEISS Presentations at MS&T 2017

Symposium Session Title Speakers/Authors
Additive Manufacturing of Metals: Microstructure and Material Properties XRM: Tomography and 3D Grain Mapping for Additive Manufacturing

Leah Lavery1, Luke Hunter1

1Carl Zeiss X-ray Microscopy, Pleasanton, California, United States

Monday, October 9, 2017

11:20 am

Room: 301

Advancements in In-situ Electron Microscopy Characterization II The Nanolab: Current and Emerging Techniques for Advanced Analytical Microscopy in Modern Materials Science

Andrew Holwell

Carl Zeiss Microscopy, Ltd., Cambridge,United Kingdom

Tuesday, October 10, 2017

2:40 pm

Room: 411

Fifty Years of Metallography and Materials Characterization Advanced Analytical Microscopy: Metallographic Characterization for the Next Fifty Years

Andrew Holwell

Carl Zeiss Microscopy, Ltd., Cambridge,United Kingdom

Tuesday, October 10, 2017

3:00 pm, Invited

Room: 409

Interfaces, Grain Boundaries and Surfaces from Atomistic and Macroscopic Approaches
3D non-destructive shape and orientation resolved grain mapping in polycrystalline silicon using laboratory diffraction contrast tomography

Hrishikesh Bale1, Ashwin Shahani2, Nicolas Gueninchault3, Arno Merkle1, Erik Lauridsen3

1Carl Zeiss X-ray Microscopy, Pleasanton, California, United States
2University of Michigan, Ann Arbor, Michigan. United States
3Xnovo Technology, Køge, Denmark

Wednesday, October 11, 2017

9:00 am

Room: 410

Multiscale Modeling of Microstructure Deformation in Material Processing 3D Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography

Leah Lavery1, Nicolas Gueninchault2, Florian Bachmann2, Christian Holzner1, Hrishikesh Bale1 & Erik Lauridsen2

1Carl Zeiss X-ray Microscopy, Pleasanton, California, United States
2Xnovo Technology, Køge, Denmark

Thursday, October 12, 2017

8:00 am, Invited

Room: 403

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