Microscopy Events

ZEISS at EIPBN 2018

May 29 - June 1, 2018 - Rio Grande, Puerto Rico, booth e

Join us and learn more about ZEISS solutions on nanofabrication and advanced imaging. Learn more about ZEISS NanoFab, the only 3-in-1 multibeam ion microscope with helium, neon, and gallium beams. Speak to one of our specialists about ZEISS Crossbeam FIB-SEM with best-in-class 3D resolution. Get more information about ZEISS GeminiSEM 450 FE-SEM for speed and surface sensitivity in your work.

ZEISS ORION NanoFab

ZEISS ORION NanoFab combines 3 beams in one. Use its neon and helium beams to fabricate sub-10 nm structures with speed and ease or use the optional gallium FIB to remove massive material. Image up to a resolution of 0.5 nm to capture high resolution images of your sample - all within the same instrument.

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ZEISS Crossbeam

Our award winning FIB-SEM speeds up your FIB applications with faster sample throughput and the highest ion beam current available in any gallium FIB-SEM. Enjoy more options with its larger chamber and exploit the variable pressure capabilities of Crossbeam 340 while Crossbeam 550 will tackle your most demanding characterizations.

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ZEISS GeminiSEM 450

ZEISS GeminiSEM 450 is your FE-SEM for speed and surface sensitivity in imaging and analytics. Image large areas quickly with excellent quality. Achieve high resolution in your EDS and EBSD analysis, especially when working with low voltages. Its optical design ensure you don't lose time in complicated realignments as you work.

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