Microscopy Events

ZEISS at Microscopy & Microanalysis (M&M) 2018

August 6-9, 2018 - Baltimore, MD, USA, Booth #624

Coffee Seminar Abstract

A new paradigm for microscopy solutions

Dr. Sreenivas Bhattiprolu, Carl Zeiss Microscopy, LLC, USA

Microscopy helps advance our knowledge of the world, but even with great images, the journey towards gaining insights can be exceptionally challenging. Consider the amount of valuable research time wasted in converting file formats to work with fragmented pieces of software! Consider the pain trying to discover features in a bulky software! Consider the frustrations with sharing data and applications with your collaborators! The new digital platform initiated by ZEISS offers the infrastructure necessary to address these problems. In this breakfast talk, Dr. Sreenivas Bhattiprolu will introduce the new microscopy solution paradigm where the researcher can take control by defining, executing, and sharing their end to end workflows. Dr. Bhattiprolu will also showcase a few real-life workflows developed on the platform by its users.

Lunch & Learn Abstracts

ZEISS LSM 8 Family with Airyscan: Revolutionize your Confocal Imaging with Increased Resolution, Sensitivity, and Speed

Renée Dalrymple, Carl Zeiss Microscopy, LLC, USA

Laser scanning confocal microscopes are a widely used imaging tool due to their ability to produce high contrast optically sectioned images for a variety of sample types and applications. Confocal microscopes use an aperture, or pinhole, at a conjugate focal plane to reject out of focus light producing an optically sectioned image. The pinhole by design discards a significant amount of light containing useful resolution and intensity information. The Airyscan detector from ZEISS improves upon the resolution, sensitivity and speed of confocal imaging by replacing the confocal pinhole with a unique area detector, which captures and utilizes more light. Resolution down to 120 nm in x,y and 350 nm in z can be achieved simultaneously with higher SNR allowing acquisitions with lower laser illumination. The Fast mode for Airyscan additionally provides the ability to image four times faster while maintaining improved resolution and SNR over conventional confocal imaging. The result is gentle superresolution imaging and the speed to quantify fast events and improve throughput. Join us and learn how ZEISS Airyscan can help your imaging experiments in completely new ways.

Correlative Raman SEM Imaging: the Sigma300 RISE microscope

Ute Schmidt, Witec GmbH, Germany

The characterization of composite materials greatly benefits the combination of different analytical methods. The interconnection of data from separate methods can deliver the comprehensive understanding often thought. When using different analysis techniques on one and the same sample, the measurement workflow can be accelerated by combining several analytical methods in one instrument. In this contribution, we present the Sigma300 RISE microscope, a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. SEM (Scanning Electron Microscopy) equipped with various accessories and detectors (SE – secondary electrons, BSE – backscattered electrons) and with microanalysis tools (EDS, CL) is a powerful tool for scientific inquiry, providing information on morphology, elemental composition and crystallography. Confocal Raman imaging of the same composite sample area reveals the chemical composition as well as polymorphisms, stress states and anisotropies. The aim of this contribution is to describe and highlight the unique features of such combined scientific analysis instruments, based on examples from composite materials.
 

Discover New Insights by Connecting Information across Dimensions with ZEN Connect

Dr. Alexandra Elli, Carl Zeiss Microscopy GmbH, Germany

ZEN Connect offers the possibility to combine multiple perspectives of a sample – across scales and across modes of acquisition– to provide answers to some of most complicated scientific questions. This software module can now bring a whole portfolio of imaging technologies – ZEISS or non-ZEISS – together. The multimodal data is automatically relocated and overlaid, and then stored in well-organized projects with intuitive image labels. The resulting data can be overlaid and stored together in one place which makes it easy to gain insights into the whole experiment and removes the difficulty associated with multiple storage locations and instruments. As a result, you gain efficiency and effectiveness with intuitive data management, simplified workflows and limitless navigation.

The figure presents an example from the neurosciences. Brain sections are labelled with GFP and Draq5 were imaged with an Axio Scan and a structure of interest was identified (A). Zoom in of the region of interest (B). The sample was transferred to an LSM equipped with an Airyscan and after retrieval the structure of interest this region was imaged in 3D with higher resolution (C). (D) shows the final 3D reconstruction of the z-stack taken with the LSM.

Happy Hour Abstracts

Connecting Modern Microscopy and Classical Metallography to Train the Next Generation of Scientists

John Peppler, ASM International

Our imaginations continue to drive the development of taller towers, stronger ships, and improved manufacturing. Despite exploding research and development in new materials, the value and importance of metals to the modern world remains clear. ASM International is a world leader in metallography education and training, offering classroom and laboratory coursework for a wide audience from career metallurgists to aspiring materials scientists in high school. In particular, metallographic preparation, microstructure interpretation, and failure analysis training programs at ASM International covers macroscopic preparation to microscopic evaluation of samples. Through a strategic partnership with ZEISS, light and electron microscopes enhance this coursework. Elemental mapping and semi-quantitative analysis of phases and constituents broaden the tools available to students. Correlative microscopy enables a convenient workflow for direct comparison of light and electron microscope contrast methods of a single area. This approach provides a complete toolbox for answering demanding industrial problems and teaching metallurgical concepts.
 

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