Microscopy Events

ZEISS at Microscopy & Microanalysis (M&M) 2018

August 6-9, 2018 - Baltimore, MD, USA, Booth #624

Coffee Seminar Abstract

A new paradigm for microscopy solutions

Dr. Sreenivas Bhattiprolu, Carl Zeiss Microscopy, LLC, USA

Microscopy helps advance our knowledge of the world, but even with great images, the journey towards gaining insights can be exceptionally challenging. Consider the amount of valuable research time wasted in converting file formats to work with fragmented pieces of software! Consider the pain trying to discover features in a bulky software! Consider the frustrations with sharing data and applications with your collaborators! The new digital platform initiated by ZEISS offers the infrastructure necessary to address these problems. In this breakfast talk, Dr. Sreenivas Bhattiprolu will introduce the new microscopy solution paradigm where the researcher can take control by defining, executing, and sharing their end to end workflows. Dr. Bhattiprolu will also showcase a few real-life workflows developed on the platform by its users.

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Lunch & Learn Abstracts

ZEISS LSM 8 Family with Airyscan: Revolutionize your Confocal Imaging with Increased Resolution, Sensitivity, and Speed

Renée Dalrymple, Carl Zeiss Microscopy, LLC, USA

Laser scanning confocal microscopes are a widely used imaging tool due to their ability to produce high contrast optically sectioned images for a variety of sample types and applications. Confocal microscopes use an aperture, or pinhole, at a conjugate focal plane to reject out of focus light producing an optically sectioned image. The pinhole by design discards a significant amount of light containing useful resolution and intensity information. The Airyscan detector from ZEISS improves upon the resolution, sensitivity and speed of confocal imaging by replacing the confocal pinhole with a unique area detector, which captures and utilizes more light. Resolution down to 120 nm in x,y and 350 nm in z can be achieved simultaneously with higher SNR allowing acquisitions with lower laser illumination. The Fast mode for Airyscan additionally provides the ability to image four times faster while maintaining improved resolution and SNR over conventional confocal imaging. The result is gentle superresolution imaging and the speed to quantify fast events and improve throughput. Join us and learn how ZEISS Airyscan can help your imaging experiments in completely new ways.

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Correlative Raman SEM Imaging: the Sigma300 RISE microscope

Part 1: SmartSEM Touch – a modern easy-to use touch interface for SEM

Roger Barnett, Carl Zeiss Microscopy, UK

We will present SmartSEM Touch, a straightforward workflow-based touch interface for SEM, now available on the ZEISS SIGMA series of microscopes and with new features. It empowers novice users to generate excellent images and achieve high throughput for simple automated imaging workflows, all without sacrificing the superb resolution and image quality possible with the ZEISS Sigma 300.

Part 2:  Correlative Raman SEM Imaging: the Sigma 300 RISE microscope

Ute Schmidt, Witec GmbH, Germany and Fang Zhou, Carl Zeiss Microscopy

The characterization of composite materials greatly benefits the combination of different analytical methods. The interconnection of data from separate methods can deliver the comprehensive understanding often thought. When using different analysis techniques on one and the same sample, the measurement workflow can be accelerated by combining several analytical methods in one instrument. In this contribution, we present the Sigma300 RISE microscope, a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. SEM (Scanning Electron Microscopy) equipped with various accessories and detectors (SE – secondary electrons, BSE – backscattered electrons) and with microanalysis tools (EDS, CL) is a powerful tool for scientific inquiry, providing information on morphology, elemental composition and crystallography. Confocal Raman imaging of the same composite sample area reveals the chemical composition as well as polymorphisms, stress states and anisotropies. The aim of this contribution is to describe and highlight the unique features of such combined scientific analysis instruments, based on examples from composite materials.

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Discover New Insights by Connecting Information across Dimensions with ZEN Connect

Dr. Alexandra Elli, Carl Zeiss Microscopy GmbH, Germany

ZEN Connect offers the possibility to combine multiple perspectives of a sample – across scales and across modes of acquisition– to provide answers to some of most complicated scientific questions. This software module can now bring a whole portfolio of imaging technologies – ZEISS or non-ZEISS – together. The multimodal data is automatically relocated and overlaid, and then stored in well-organized projects with intuitive image labels. The resulting data can be overlaid and stored together in one place which makes it easy to gain insights into the whole experiment and removes the difficulty associated with multiple storage locations and instruments. As a result, you gain efficiency and effectiveness with intuitive data management, simplified workflows and limitless navigation.

Happy Hour Abstracts

REFINE Your View, Imaging Tales from a Multi-Modal Lab

Dr. Sina Shahbazmohamadi, University of Connecticut

Multi-modal characterization workflows require a suite of tools that interact in such a way that details typically omitted or overlooked by singular techniques are elucidated in an easy to obtain and well correlated fashion. Whether spanning traditional throughput, length scale, or sample interaction limitations, imaging tools are increasingly capable of utilizing data from one instrument to guide the efforts undertaken by additional downstream methods. Examples of multi-modal investigations on advanced coatings will be used to illustrate the impact of complementary information from various forms of microscopy including both non-destructive (XRM) and destructive (FIBSEM) forms of 3-dimensional analysis.

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Connecting Modern Microscopy and Classical Metallography to Train the Next Generation of Scientists

John Peppler, ASM International

Our imaginations continue to drive the development of taller towers, stronger ships, and improved manufacturing. Despite exploding research and development in new materials, the value and importance of metals to the modern world remains clear. ASM International is a world leader in metallography education and training, offering classroom and laboratory coursework for a wide audience from career metallurgists to aspiring materials scientists in high school. In particular, metallographic preparation, microstructure interpretation, and failure analysis training programs at ASM International covers macroscopic preparation to microscopic evaluation of samples. Through a strategic partnership with ZEISS, light and electron microscopes enhance this coursework. Elemental mapping and semi-quantitative analysis of phases and constituents broaden the tools available to students. Correlative microscopy enables a convenient workflow for direct comparison of light and electron microscope contrast methods of a single area. This approach provides a complete toolbox for answering demanding industrial problems and teaching metallurgical concepts.

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