Microscopy Events

ZEISS Lunch and Learn at Microscopy & Microanalysis 2018

Tuesday, August 7, 2018 – 12:00 PM - 1:00 PM

Correlative Raman SEM Imaging: ZEISS Sigma300 RISE

Ute Schmidt, Witec GmbH, Germany

The characterization of composite materials greatly benefits the combination of different analytical methods. The interconnection of data from separate methods can deliver the comprehensive understanding often thought. When using different analysis techniques on one and the same sample, the measurement workflow can be accelerated by combining several analytical methods in one instrument. In this contribution, we present ZEISS Sigma300 RISE microscope, a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. SEM (Scanning Electron Microscopy) equipped with various accessories and detectors (SE – secondary electrons, BSE – backscattered electrons) and with microanalysis tools (EDS, CL) is a powerful tool for scientific inquiry, providing information on morphology, elemental composition and crystallography. Confocal Raman imaging of the same composite sample area reveals the chemical composition as well as polymorphisms, stress states and anisotropies.

The aim of this contribution is to describe and highlight the unique features of such combined scientific analysis instruments, based on examples from composite materials.

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