Microscopy Events

ZEISS at the Materials Science & Technology Show

October 14 - 18, 2018 - Columbus, OH, USA, booth #504

Stop by our booth at MS&T 2018 to see our wide array of microscope products. Come immerse yourself in our solutions to your technical applications live in our booth or speak with a ZEISS expert to help you establish the best solutions to fit your needs.

Light Microscopes

ZEISS Axio Lab.A1

ZEISS Axio Lab.A1

Axio Lab.A1 is your reliable reflected light microscope for routine applications in the laboratory offering the flexibility required for successful examinations. A variety of contrasting technique are available for defect analysis, quality inspection and materials testing.

ZEISS Axio Observer

ZEISS Axio Observer

The ZEISS Axio Observer is the go to inverted metallographic microscope for investigation, development and analysis of materials. You can count on the quality of ZEISS optics for reliability and brilliant images. As an open imaging platform you can invest in the features you need currently and upgrade your instrument when you need it.

ZEISS Smartzoom 5

ZEISS Smartzoom 5

ZEISS Smartzoom5 is your digital microscope for the non-microscopist. With “google earth” like navigation and guided workflows results are quick and reliable. Whether you are taking 2D or 3D micro-measurements, routine inspecting or documenting component failures you can count on quality imaging with an integrated system approach.

Electron and X-ray Microscopes

ZEISS EVO

ZEISS EVO

Combine high performance SEM with an intuitive, user-friendly experience. Its comprehensive range of options, including LaB6 and VP mode, lets you tailor EVO to your requirements, whether material sciences or routine industrial quality assurance and failure analysis.

ZEISS Crossbeam

ZEISS Crossbeam

Our award winning FIB-SEM that speeds up your FIB applications with faster sample throughput and the highest ion beam current available in any gallium FIB-SEM. Enjoy more options with its larger chamber, Exploit the variable pressure capabilities of Crossbeam 340 or have Crossbeam 550 tackle your most demanding characterizations.

ZEISS Xradia 520 Versa

ZEISS Xradia Versa

Unlock versatility for your scientific discovery with ZEISS Xradia Versa. Image non-destructively to reveal tomography of three-dimensional microstructure and voids from a range of materials. Extend your system with LabDCT to acquire and reconstruct crystallographic information from polycrystalline samples, such as metals and alloys.