ZEISS at Neuroscience 2018

November 4 - 7, 2018 | San Diego, CA, USA, Booth #2313

Connecting Your Data

Visit booth #2313 to learn about neuroscience solutions from ZEISS. Connect your data from light, electron and X-ray microscopy solutions and gain novel insight to neural connections.

  • Attend our seminars to learn from experts about the lastest microscopy innovations and advancements
  • Request a demonstration to experience first hand the benefits of a ZEISS system
  • Discuss your complicated applications with our experts and find the perfect solution for your experiments

Book Your Demonstration

View all available systems at our booth

Experience ZEISS microscopy solutions first hand and learn how they benefit your research. Schedule a demo and have our experts image your samples and guide you through the system capabilities.

Microscopy Software Solutions

ZEISS ZEN Connect
Connect with your data by combining multiple perspectives of your sample. Overlay and align your images from different imaging technologies - ZEISS or not - and gain unique insights by seeing your data in context.

ZEISS ZEN Intellesis & Image Analysis
Use deep learning to segment your images with the powerful deep learning algorithms and the Python infrastructure of the ZEN Intellesis software module.

APEER - New Microscopy Solutions Platform
A new paradigm in microscopy solutions platform initiated by ZEISS that offers researchers the infrastructure to define, execute, and share their end to end workflows.

arivis InViewR 3D Visualization
Dive deep into your 3D image data in virtual reality and view your samples as never before. Use your hands to move, rotate, scale, and shape your digital image data.

Light Microscopy

ZEISS Axio Examiner.D1
Upright fixed stage microscope to perform your patch clamp experiments. It is optimized for low vibrations with generous room for micromanipulation and patch clamp accessories.

ZEISS Axio Imager.2 with Apotome.2
Upright research microscope with brilliant optics and bright fluorescence. Use ZEISS Apotome.2 to create optical sections of your samples and prevent scattered out-of-focus light for confocal-like images.

ZEISS Axio Observer
Flexible research grade inverted microscope with a stable stand for demanding multimodal imaging of living and fixed specimens. Tailor Axio Observer to your needs by adding incubation, LED illumination and more!

ZEISS Axiocam Cameras
Document and record your samples from a wide range of microscope cameras from ZEISS. Choose from entry level cameras to sensitive high-performance cameras, many with color or monochrome versions.

ZEISS Digital Classroom
Stay connected with your students with a digital classroom of connected microscope to foster education. View what your students and let them see what you see via ZEISS Labscope on an iPad or iPhone.

Confocal & Imaging Systems

ZEISS Lightsheet Z.1
Capture optical sections of large samples with virtually no phototoxicity or bleaching with high temporal resolution. Image at sub-cellular resolution in a fraction of the time it takes using other techniques.

ZEISS LSM 800 with Airyscan and Cryo-Workflow
Compact confocal microscope with highly sensitive GaAsP detection and fast linear scanning. The Airyscan detector pushes the sensitivity and superresolution imaging beyond the limits of all conventional confocals.

ZEISS LSM 880 with Airyscan for Multiphoton Imaging
Confocal microscope to image thick sample to capture the smallest structures, the faintest signal or track the fastest process - or do all that at once.

Electron Microscopy

ZEISS MultiSEM
World's fasterst SEM with 91 parallel beams to capture centimer-scale specimens at nanometer resolutions and at unprecedented speed. The system is designed for continuous, reliable 24/7 operation.

ZEISS Focal Charge Compensation
See Focal Charge Compensation in action where it was developed together with ZEISS and The National Center for Microscopy and Imaging Research (NCMIR), led by Mark Ellisman.

Register For a Seminar

Gain microscopy insights

Register for our talks at the booth to learn from experts and gain new insights on the lastest innovations in microscopy and their applications.

Sunday, November 4, 2018
12 PM - 1 PM
ZEISS Airyscan Detector

Part 1:
Resolving Brain Structures and Signaling in vivo with ZEISS Airyscan

Joseph Huff, Application Development Engineer 3D Systems, Life Sciences, Carl Zeiss Microscopy GmbH, Jena, Germany

Fluorescence microscopy allows for researchers to study the structure and function of the brain in both fixed samples and in vivo. Laser scanning microscopy, confocal and multi-photon, serve as the standard imaging approaches for imaging into scattering samples. However, due to the light scattering properties brain tissue, LSM suffers in both depth penetration and resolution. By combining the unique ZEISS Airyscan detection concept with multiphoton excitation, the resolution and signal-to-noise benefits of Airyscan can be extended to deeper layers of the cortex (2-3x deeper than traditional confocal). In addition, combining Airyscan with GRIN lens technology enables increased resolution and signal-to-noise while imaging other regions of the brain that are unreachable traditional in vivo microscopy.


Part 2:
Simultaneous Monitoring and Manipulation of Neural Circuit Dynamics in Freely Behaving Mice and Co-Registration of Enhanced Anatomical Detail with ZEISS Airyscan Head Fixed Data
Dr. Shanna Resendez, Regional Manager - Field Scientific Consultant, Inscopix Inc, Palo Alto, CA

The development of Ca2+ indicators for visualizing dynamic cellular activity has revolutionized systems neuroscience. However, due to the size and rigidity of traditional microscopy systems, the use of these indicators for the study of brain function has been limited to head fixed behaviors or anesthetized animal preparations. To circumvent this limitation, we have developed miniature lightweight microscopy systems (nVista and nVoke) that allow for cellular-resolution imaging and optogenetic manipulation in freely behaving animals. Our miniature microscopy systems have been optimized for paired use with chronically implanted GRIN lenses of various lengths enabling optical access to cortical and subcortical brain regions greatly expanding the types of behaviors that can be decoded, from naturalistic social behaviors in mice to complex cognitive processes in primates. Subsequent developments at Inscopix to enable co-registration of ZEISS Airyscan data with Inscopix’s large-scale neural activity data in freely moving animals represents a long-sought marriage of two cornerstone imaging modalities. Integrating subcellular and structural detail with functional neural network data can provide exciting new insights into brain function and dysfunction.

Monday, November 5, 2018
12 PM - 1 PM
Serial Block-Face SEM of Nonconductive Samples

High-Performance Serial Block-face SEM of Nonconductive Biological Samples Enabled by Focal Gas Injection-Based Charge Compensation
Thomas Deerinck and Mark Ellisman, The National Center for Microscopy and Imaging Research, UCSD, La Jolla, California

Serial block-face scanning electron microscopy (SBEM) is rapidly becoming the method of choice for obtaining large-scale 3-D imaging data of biological specimens at nanometer-scale resolution. One of the principle limitations of this method is that specimens must be embedded in non-conductive epoxy resin prior to imaging, and this can lead to substantial specimen charging. Typically, cells and tissues are intensely heavy-metal stained in order to improve backscattered electron yield at low accelerating voltages and to reduce specimen charging. However, not all specimen charging can be eliminated in charge-probe samples such as those containing large open spaces or with low lipid content. Most commonly, variable-pressure SEM (VP-SEM) is used for many specimens to minimize charging, but at a significant loss of signal-to-noise and resolution owing to electron-gas interactions. Here we introduce an approach to adapt the method of focal gas injection-based charge compensation to SBEM. This approach, which we call Focal Charge Compensation (Focal CC), uses a fine needle to inject nitrogen gas directly over the surface of the sample block-face. Secondary electrons emitted from the sample surface ionize the gas molecules and the resulting ions dissipate the charge. Since the needle must be retracted during the cutting cycle, a simple device was designed to precisely deliver the gas over the sample during imaging and automatically retract during the cutting cycle. Since the overall chamber pressure is at high vacuum (<7x10-3 mbar), the signal-to-noise and resolution at the low accelerating voltages normally used for SBEM are vastly superior to VP-SEM.

Focal CC represents a major step forward in block-face imaging, as now even the most charge-prone samples can be imaged without charging artifacts. Because the primary electrons only have to traverse a thin layer of nitrogen gas molecules near the sample surface, beam current is only marginally decreased when compared to VP-SEM. This means that shorter pixel dwell times can be used (0.5-1 µsec), reducing specimen beam damage and resulting in faster data acquisition times. Additionally, beam skirting is also greatly reduced, resulting in superior spatial resolution. Finally, image jitter due to residual specimen charging is eliminated, making post-processing of image stacks to correct for this phenomenon unnecessary.

Tuesday, November 6, 2018
12 PM - 1 PM
Cryo Light and Electron Microscopy

Cryo Light and Electron Microscopy: High Content - High Flexibility - High Resolution
Dr. Robert Kirmse, Application Development Engineer BioEM, Life Sciences, Carl Zeiss Microscopy GmbH, Germany

The investigation of vitrified biological specimens enables the visualization of cellular ultrastructure in a near-to-native fully hydrated state, unadulterated by harmful preparation methods. Utilizing Light and Electron Microscopy in combination is the next step for cryo microscopy workflows. ZEISS’ unique technologies with Airyscan and Crossbeam allow the analysis of functional and structural information under cryo conditions at high resolution, providing invaluable data for every step.

In this seminar, we will present two unique cryo imaging modalities and discuss their impact on cryo correlative workflows. First, we present confocal cryo fluorescence microscopy, utilizing the unique ZEISS Airyscan detector to improved signal to noise ratio (SNR) and resolution. Second, we present how large volume imaging using focused ion beam scanning electron microscopy (FIB/SEM) is offering new insights into vitrified specimens. Ultimately, both technologies are combined into a correlative workflow that offers full flexibility for each step providing high-resolution data and results in lamellas for cryo electron tomography.

Wednesday, November 7, 2018
12 PM - 1 PM
Discover New Insights with ZEISS ZEN Connect

Discover New Insights by Connecting Information Across Dimensions with ZEISS ZEN Connect
Dr. Alexandra Elli, Solution Manager BioEM / XRM, Life Sciences, Carl Zeiss Microscopy GmbH, Germany

ZEN Connect offers the possibility to combine multiple perspectives of a sample – across scales and across modes of acquisition– to provide answers to some of most complicated scientific questions. This software module can now bring a whole portfolio of imaging technologies – ZEISS or non-ZEISS – together. The multimodal data is automatically relocated and overlaid, and then stored in well-organized projects with intuitive image labels. The resulting data can be overlaid and stored together in one place which makes it easy to gain insights into the whole experiment and removes the difficulty associated with multiple storage locations and instruments. As a result, you gain efficiency and effectiveness with intuitive data management, simplified workflows and limitless navigation.

Location and Directions

San Diego Convention Center | ZEISS booth #2313

San Diego Convention Center

ZEISS booth #2313
111 W Harbor Dr
San Diego, CA 92101

Directions

Contact

Have a question? Fill out the form to get in touch with us.