ZEISS Microscopy Advanced Analytical Microscopy User Meeting

March 21-22, 2018 - ZEISS Microscopy Customer Center Bay Area

Join us for an interactive user meeting focused around new advancements in analytical microscopy techniques. During this meeting you will have the opportunity to meet and network with fellow microscopists using analytical techniques to address their materials challenges. There will be a unique deep dive with hands-on sessions with ZEISS applications experts on the range of optical, electron, ion, and X-ray microscopy equipment in the facility.


March 21-22, 2018


ZEISS Microscopy Customer Center Bay Area
4385 Hopyard Rd
Pleasanton, CA 94588

Meeting Topics

Gain first-hand experience with advances in a variety of techniques, including:

  • Integrated Raman and scanning electron microscopy
  • High resolution 3D analytics using focused ion beam tomography
  • Nondestructive 3D grain mapping of crystalline materials by X-ray based diffraction contrast tomography
  • Surface roughness and topography evaluation through confocal laser scanning microscopy
  • and more…

Invited Speakers Confirmed for the Event

Yijin Liu, Staff Scientist, Stanford Synchrotron Radiation Lightsource
Olga Ovchinnikova, Staff Scientist, Oak Ridge National Laboratory
Sina Shahbazmohamadi, Assistant Professor, Director of REFINE Lab, University of Connecticut
Timo Bernthaler, Member Institute Board, Institute for Materials Research, Hochshule Aalen, Germany

We would also like to welcome additional contributions for speaking slots highlighting recent applications of materials microscopy. If you’d like to submit a talk, please click here to send a title and short abstract for consideration.


Day 1 - Wednesday, March 21, 2018

8:30am - 8:45am Breakfast and Welcome
8:45am - 9:30am Seminar
Correlative microscopy on materials for energy conversion, additive processing and energy storage
9:30am - 10:00am Seminar
Advances in EDS and EBSD and the impact on 3D analyses
10:00am - 10:20am Coffee Break
10:20am - 11:05am Seminar
Multimodal Imaging for Physical and Chemical Surface Characterization using a Combined Helium Ion Microscope and Secondary Ion Mass Spectrometry Platform
11:05am - 11:35am Seminar
Correlative Raman SEM Imaging: the Sigma300 RISE microscope
11:35am- 12:05pm Seminar
On the use of multi-modal microscopy to study a variety of engineering material systems
12:05pm - 12:50pm Lunch
12:50pm - 1:50pm System Station
ZEISS Sigma with RISE
1:50pm - 2:50pm System Station
ZEISS LSM 800 and Smartzoom 5
2:50pm - 3:00pm Coffee Break
3:00pm - 4:00pm System Station
ZEISS Xradia Versa and ZEISS Xradia Ultra
4:00pm - 5:00pm System Station
5:15pm Transportation for Evening Event
Bus leaves for GoKart Racing and dinner

Day 2 - Thursday, March 22, 2018

8:30am - 9:00am Breakfast
9:00am - 9:45am Seminar
Correlative Microscopy in Studying Advanced Coatings
9:45am - 10:15am Seminar
A new programmable detector for STEM imaging
10:15am - 10:35am Coffee Break
10:35am - 11:20am Seminar
Scientific data/information mining in X-ray spectro-microscopic study of energy storage materials
11:20am - 11:50am Seminar
Integrated imaging in 3D:A new lens on grain boundaries, particles and their correlations in Poly-Si
11:50am - 1:00pm Lunch
1:00pm - 2:00pm System Station
ZEISS GeminiSEM 500 with Oxford X-max Extreme
2:00pm - 3:00pm System Station
ZEISS Crossbeam 550 with Oxford EDS and EBSD
3:00pm - 3:15pm Wrap-up


Discounted hotel rooms are available within walking distance of the facility. Click here to book your hotel.

Please contact us if you have any questions or would like to schedule additional time with one of our application specialists during your visit.