ZEISS Microscopy Advanced Analytical Microscopy User Meeting

March 21-22, 2018 - ZEISS Microscopy Customer Center Bay Area

Join us for an interactive user meeting focused around new advancements in analytical microscopy techniques. During this meeting you will have the opportunity to meet and network with fellow microscopists using analytical techniques to address their materials challenges. There will be a unique deep dive with hands-on sessions with ZEISS applications experts on the range of optical, electron, ion, and X-ray microscopy equipment in the facility.

Date:

March 21-22, 2018

Location

ZEISS Microscopy Customer Center Bay Area
4385 Hopyard Rd
Pleasanton, CA 94588

Gain first-hand experience with advances in a variety of techniques, including:

  • Integrated Raman and scanning electron microscopy
  • High resolution 3D analytics using focused ion beam tomography
  • Nondestructive 3D grain mapping of crystalline materials by X-ray based diffraction contrast tomography
  • Surface roughness and topography evaluation through confocal laser scanning microscopy
  • and more…

Meeting Topics

Yijin Liu, Staff Scientist, Stanford Synchrotron Radiation Lightsource
Olga Ovchinnikova, Staff Scientist, Oak Ridge National Laboratory
Sina Shahbazmohamadi, Assistant Professor, Director of REFINE Lab, University of Connecticut
Timo Bernthaler, Professor, Institute for Materials Research, Hochshule Aalen, Germany

We would also like to welcome additional contributions for speaking slots highlighting recent applications of materials microscopy. If you’d like to submit a talk, please click here to send a title and short abstract for consideration.

Invited Speakers Confirmed for the Event

Hotel

Discounted hotel rooms are available within walking distance of the facility. Click here to book your hotel.

Please contact us if you have any questions or would like to schedule additional time with one of our application specialists during your visit.

Register

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