ZEISS at Microscopy & Microanalysis (M&M) 2019

Connect with ZEISS at Booth #1117
August 5 - 8, 2019 – Portland, OR, USA

Connect with ZEISS at M&M 2019 in Portland to explore the latest microscopy innovations and advancements through hands-on technology demonstrations and daily in-booth educational presentations.

Meet our experts to learn how ZEISS can help you advance research, achieve insights, and minimize time-to-result with the latest in our portfolio of light, confocal, electron/ion and X-ray microscopy solutions.

Lunch & Learn

Evening Tutorial

Book a Demo

Electron/Ion Microscopes

Book a Demo

Confocal Microscopes

Book a Demo

Light Microscopes

Book a Demo

X-ray Microscopes

Connect with ZEISS for In-Booth Educational Presentations

Hear about the latest trends, discover new insights and learn about technology innovations from our product management team.

Spend your lunch hour in the ZEISS booth.

Register now to secure your lunch.

Register for just one or all the topics that interest you!

Day

Title

 

Monday
12:00 pm

Non-destructive 3D Grain Mapping by Laboratory X-ray Diffraction Contrast Tomography

Abstract/Registration

Tuesday 
12:00 pm

ZEISS MultiSEM – The Fastest Scanning Electron Microscope in the World Enables Extreme-scale Electron Microscopy

Abstract/Registration

Wednesday
12:00 pm

The New ZEISS SIMS Portfolio – Compositional Analysis at all Length Scales

Abstract/Registration

Connect with Key Opinion Leaders for our Evening Tutorials

Hear from industry peers and how they achieved their microscopy challenges.

Enjoy happy hour in the ZEISS booth.

As these events happen after the exhibit hall closes, you must be registered to attend.

Please register at the M&M Megabooth booth #502. They will provide you with a ticket for re-entry in the exhibit hall.
 

Day

Title

 

Tuesday 
5:45 pm

A Sneak Preview of the Latest Atlas 5 2D & 3D Features
for Crossbeam and SEM Microscopes

Abstract/Registration

Wednesday
5:45 pm

“Nice image, what am I looking at?” -
Nano-analysis on the HIM using the VECTOR500 SIMS

Abstract/Registration

ZEISS Scientific Talks and Posters

Day

Title

Authors

Location

Monday 
3:00 pm - 5:00 pm

Mapping the Evolution of Grains in Strontium Titanate through Laboratory based 4D Diffraction Contrast Tomography

A Krause, H Bale, J Sun, W Harris, E Lauridsen, C Marvel, C Krill, M Harmer

Exhibit Hall
Poster #12

Tuesday
10:30 am

Multiscale 3D Investigation of Damage in Angle-Interlocked Ceramic Matrix Composite under in situ Loading

A Badran, H Bale, S Kelly, D Marshall

Room: C122

Tuesday
11:00 am

ZEISS ORION NanoFab: New SIMS Spectrometer

JA Notte, D Runt, F Khanom, B Lewis, S Sijbrandij, C Guillermier, D Dowsett

Room: C120-121

Tuesday
11:15 am

Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography

J Sun, H Bale, F Bachmann, J Oddershede, ST
Kelly, W Harris, EM Lauridsen

Room: C122

Tuesday
11:30 am

ZEISS Orion NanoFab New Features: “Shuttle and Find” and Automation

A Morin, J Notte, D Runt

Room: C120-121

Tuesday
2:30 pm

Formation of Faceted Spirals during Directional Eutectic Solidification

S Moniri, H Bale, T Volkenandt, S Kelly, A Shahani

Room: C122

Tuesday
3:00 pm - 5:00 pm

Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification

K Crosby, T Garbowski, S Nickell

Exhibit Hall
Poster #90

Tuesday
3:00 pm - 5:00 pm

A 331-Beam Scanning Electron Microscope

S Nickell, D Zeidler

Exhibit Hall
Poster #136

Wednesday
9:30 am 

From Images to Insights: Working with Large Data in Cell Biological Imaging

Christian Götze, Vice President Imaging, arivis AG

Room: C 120-121

Thursday
9:30 am

The Benefits of Correlative Scanning Electron - and Confocal Raman Microscopy for the Characterization of Polymers, 2D Materials and Lithium Oxides

Ute Schmidt1, Wei Liu2, David Steinmetz1, Stefanie Freitag3
1. WITec GmbH, 89089 Ulm, Germany
2. WITec Instruments Corp., 37922 Knoxville, Tennessee, USA
3. Carl Zeiss Microscopy GmbH, 81369 Munich, Germany

Room: F149

Connect with ZEISS Microscopy Experts – Book your one-on-one Demonstration

Don’t miss this opportunity to explore our latest microscopes.

While we bring most of our technology, some systems simply can’t be set up for a tradeshow - meet one-on-one with product specialists for these tools who can discuss your challenges, answer your questions, share application data and provide information on these instruments.

Electron/Ion Microscopes

Book a demo

ZEISS Crossbeam 350

3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples

Book a demo

ZEISS EVO Refresh

Capture outstanding topographical details at low voltages with beam deceleration and high definition backscattered electron imaging

Book a demo

ZEISS GeminiSEM 450

Get sub-nanometer resolution and high detection efficiency, even in variable pressure mode

Book a demo

ZEISS MultiSEM

Learn how you can unleash the acquisition speed of 91 parallel electron beams in the fastest scanning electron microscope in the world.

Book a demo

ZEISS ORION

The only system in the world that covers the complete range of micromachining to nanomachining applications using gallium, neon and helium ion beams integrated in a single instrument

Book a demo

ZEISS Sigma 300 VP

Combine field emission SEM technology with advanced analytics. Image particles, surfaces, and nanostructures

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Confocal Microscopes

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ZEISS LSM 800 Cryo

Compact confocal microscope with highly sensitive GaAsP detection and fast linear scanning. The Airyscan detector pushes the sensitivity and superresolution imaging beyond the limits of all conventional confocals.

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Light Microscopes

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ZEISS Axio Observer for Materials

Your inverted research microscope for investigation, development and analysis of materials

Book a demo

ZEISS Smart Microscopy

Your workflow for more efficient imaging in any industry

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ZEISS Smartzoom 5

Your smart digital microscope - ideal for quality control and quality assurance applications in virtually every field of industry

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ZEISS ZEN Intellesis

Use deep learning to segment your images with the powerful deep learning algorithms and the Python infrastructure of the ZEN Intellesis software module.

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X-ray Microscopes

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ZEISS Xradia Versa

Submicron XRM which uses patented X-ray detectors within a microscope turret of objectives for easy zooming down past 500 nm spatial resolution with minimum achievable voxels of 40 nm

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