ZEISS Lunch and Learn at Microscopy & Microanalysis (M&M) 2019

Tuesday, August 6, 2019 – 12:00 pm - 1:00 pm

ZEISS MultiSEM – the fastest scanning electron microscope in the world enables extreme-scale electron microscopy
Kyle Crosby1, Anna Lena Eberle2 & Stephan Nickell2
1 Carl Zeiss Microscopy LLC, One Zeiss Drive, Thornwood, NY 10594
2 Carl Zeiss Microscopy GmbH, Carl Zeiss Strasse 22, 73447 Oberkochen, Germany

Recent years have witnessed major progress in three-dimensional (3D) microscopy techniques for the life sciences as well as materials research. Recently, multi-beam SEM technology for imaging of large sample areas has been established, mainly in the field of connectomics, but also in other areas such as reverse engineering of integrated circuits or large-area statistical evaluations of geological or material samples. The MultiSEM family features up to 91 electron beams scanning in parallel, resulting in an imaging throughput of up to 2 TeraPixels per hour. At this rate the MultiSEM family currently provides the fastest scanning electron microscopes in the world. Complemented by new developments regarding automated sample preparation protocols and devices, the promise of mapping larger sample volumes at high resolution is now within reach.

This talk will give an overview of various application examples and explain recent technological developments related to ZEISS MultiSEM.

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