ZEISS Lunch and Learn at Microscopy & Microanalysis (M&M) 2019

Wednesday, August 7, 2019 – 12:00 pm - 1:00 pm

The new ZEISS SIMS portfolio – Compositional analysis at all length scales
Fabián Pérez-Willard & Doug Runt

When it comes to elemental analysis of low concentrations or light elements, Secondary Ion Mass Spectroscopy (SIMS) is the technique of choice for materials characterization. It not only allows to detect element traces down to the ppm level, it also enables detection of all elements of the periodic table and even clusters or small molecules. In this Lunch and Learn we will give you an insight into this technology and present the new ZEISS SIMS portfolio covering some applications in battery and solar cell research and steel failure analysis. ZEISS Crossbeam now features a TOF-SIMS addon which enables mapping of all masses at the same time with a lateral resolution of better than 35 nm. For even higher demands we introduced SIMS on the ZEISS ORION NanoFab. In addition to superior imaging and nano-patterning capabilities with the helium ion beam, the ORION NanoFab offers SIMS at the best available lateral resolution of better than 20 nm using the neon ion beam.

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