ZEISS at MRS Fall

December 3 - 5, 2019 - Boston, MA, USA, booth #310

Join us and learn how ZEISS can support your materials research. Our microscopy solutions complete with light, electron, ion and X-ray imaging technologies equip you to address multi-scale microstructure characterization problems in materials science and beyond.

ZEISS Axio Imager 2 for Materials

Introduce high performance light microscopy into your workflow - Axio Imager 2 ensures accurate and reproducible results with a large suite of software solutions. Also choose from a wide variety of unique Contrasting Techniques to see what you have been missing. Expand your applications with solutions such as: Confocal Surface Analysis, Microstructural Analysis and/or a Correlative Microscopy workflow which bridges the gap between Light and Electron microscopy.

ZEISS C-SEM, FE-SEM, and FIB-SEM

Capture fine surface detail with superior contrast for any sample type on the user friendly ZEISS GeminiSEM. Rapidly access 3D volumes while minimizing sample damage with femtosecond laser milling on the ZEISS Crossbeam. Make challenging 3D correlative imaging and microanalysis studies routine with Atlas 5 guided workflows.

ZEISS ORION NanoFab

Leverage precision and efficiency in multi-scale nanofabrication tasks by having three ion beams in one instrument. Traditional gallium FIB removes massive amounts of material, neon beam provides rapid fine polishing, and helium beam achieves sub-10 nm structures without having to transfer samples between different systems.

ZEISS Xradia XRM

Acquire 3D insights directly and set up subsequent targeted FIBSEM experiments with non-destructive tomographic imaging. Lab based synchrotron-like technology allows users to image at the best contrast and highest resolution without relying on hard to access beamline facilities. LabDCT module unlocks crystallographic and grain structure information from poly-crystalline samples without the need for advanced sample preparation.

Join us at Symposium Sessions

Advanced Ion Beam Sessions

Monday, December 2	Title	Authors	Location
10:30 am	Unravelling the Origins of Functionality through Correlative Multimodal Chemical Imaging	Olga Ovchinnikova¹, Anton Ievlev¹, Alex Belianinov¹ (Oak Ridge National Laboratory¹)	MT05.01.01 (Hynes, Level 2, Room 204)
11:00 am	Exploring a FIB-SEM Research Data Ecosystem	Keana Scott¹, Alline Myers¹, Peter Bajcsy¹ (National Institute of Standards and Technology¹)	MT05.01.02 (Hynes, Level 2, Room 204)
11:30 am	Ultra-High Precision Engineering of 2D Nanomaterials Using Energetic Focused Ion Beam Technologies	Songkil Kim¹ (Pusan National University¹)	MT05.01.03 (Hynes, Level 2, Room 204)
2:30 pm	Comparison of Gallium and Neon Ion Beam Milling on GaAs	Deying Xia¹, John Notte¹, Ying-Bing Jiang², Brett Lewis¹ (Carl Zeiss¹,The University of New Mexico²)	MT05.02.03 (Hynes, Level 2, Room 204)
2:45 pm	Ne-FIB Fabrication of Tips for Atom Probe Tomography	John Notte³, Frances Allen^1,2, Paul Blanchard⁴, Norman Sanford⁴, Ruopeng Zhang^1,2,Andrew Minor^1,2,Soeren Eyhusen³ (University of California, Berkeley¹, Lawrence Berkeley National Laboratory², Carl Zeiss Microscopy³, National Institute of Standards and Technology⁴)	MT05.02.04 (Hynes, Level 2, Room 204)
4:15 pm	Comparison of Several Focused Ion Beam Fabrication Methods for Quantitative In Situ Small-Scale Mechanical Testing	Yang Yang¹, Frances Allen^1,2, Andrew Minor^1,2 (Lawrence Berkeley National Laboratory¹,University of California, Berkeley²)	MT05.02.07 (Hynes, Level 2, Room 204)
4:45 pm	Transfer of Sub-10 nm Patterns to Substrate Using Helium Ion Beam Lithography and Reactive-Ion Etch	Matthew Hunt¹, S. Lewis^1,2, N. Lee¹, H. Alty², J. Yang^1,3, A. Wertheim¹, G. DeRose¹, Stephen Yeates², Richard Winpenny², A. Scherer¹ (California Institute of Technology¹, The University of Manchester², Stanford University³)	MT05.02.09 (Hynes, Level 2, Room 204)

Monday - Expand Monday - Collapse

Tuesday, December 3	Title	Authors	Location
9:00 am	Local and Macroscale Property Control of Ferroic Thin-Film Materials with Ion Beams	Lane Martin^1,2 (University of California, Berkeley¹,Lawrence Berkeley National Laboratory²)	MT05.03.01 (Hynes, Level 2, Room 204)
9:30 am	Fabrication of Single Atom Devices by Direct Write Nanofabrication	Edward Bielejec¹ (Sandia National Laboratories¹)	MT05.03.02 (Hynes, Level 2, Room 204)
10:30 am	Neuromorphic MoS₂ Memtransistors Fabricated by Localised Helium Ion Beam Irradiation	Hongzhou Zhang¹, Jakub Jadwiszczak¹, Darragh Keane¹, Gregor Hlawacek² (Trinity College¹, Institute of Ion Beam Physics and Materials Research²)	MT05.03.03 (Hynes, Level 2, Room 204)
11:30 am	Phase Transitions in He⁺ FIB-Irradiated VO₂ Observed with 4D-STEM Imaging	Steven Zeltmann¹, Lei Jin¹, Frances Allen¹, Junqiao Wu¹, Andrew Minor^1,2 (University of California, Berkeley¹, Lawrence Berkeley National Laboratory²)	MT05.03.05 (Hynes, Level 2, Room 204)
11:45 am	Use of Helium-FIB to Study Helium Ion Irradiation Effects for a Tungsten Target	Mehdi Balooch¹, Frances Allen¹, Peter Hosemann¹ (University of California, Berkeley¹)	MT05.03.06 (Hynes, Level 2, Room 204)
1:30 pm	Nanoscale Superconducting Quantum Devices Based on High Transition Temperature Superconductor Materials Fabricated by Focused Helium Ion Beam	Hao Li¹,Ethan Cho¹,Shane Cybart¹ (University of California, Riverside¹)	MT05.04.01 (Hynes, Level 2, Room 204)
2:00 pm	Superconducting Nanoscale Detectors Fabricated Using Precision Dislocation Engineering	Ilya Charaev¹, Glenn Martinez¹, Denis Bandurin¹, Andrew Dane¹, Reza Baghdadi¹, Marco Colangelo¹,Karl Berggren¹ (Massachusetts Institute of Technology1)	MT05.04.02 (Hynes, Level 2, Room 204)
2:15 pm	Ion Beam Induced Damage in MgB₂ and Co-Doped Ba(FeAs)₂ Thin Films for Josephson Junctions	Leila Kasaei¹, Hussein Hijazi¹, Mengjun Li¹, Ryan Thorpe¹, Hongbin Yang¹, Philip Batson¹, Ke Chen², Torgny Gustafsson¹, Xiaoxing Xi², Leonard Feldman¹ (Rutgers University¹,Temple University²)	MT05.04.03 (Hynes, Level 2, Room 204)
2:30 pm	Nanoscale Devices Fabricated by Focused Ion Beam Irradiation of YBa₂Cu₃O₇ Thin Films	Max Karrer¹ (University Tübingen¹)	MT05.04.04 (Hynes, Level 2, Room 204)
4:00 pm	Advances in FIB Nanotomography—Towards 1 nm³ Voxels	Michael Phaneuf¹, Alexandre Laquerre¹, Ken Lagarec¹ (Fibics Incorporated¹)	MT05.05.02 (Hynes, Level 2, Room 204)
4:30 pm	In-Situ Correlative Analysis of Ion-Beam Treated Nanostructures by Combination of AFM and FIB	Christian Schwalb¹, Stefan Hummel¹, Robert Winkler², Jurgen Sattelkow², Pinar Frank¹, Gregor Hlawacek³, Peter Hosemann⁴, Georg Fantner⁵, Harald Plank² (GETec Microscopy¹,Technical University Graz²,Helmholtz-Zentrum Dresden-Rossendorf³,University of California, Berkeley⁴,EPFL⁵)	MT05.05.03 (Hynes, Level 2, Room 204)

Tuesday - Expand Tuesday - Collapse

Wednesday, December 4	Title	Authors	Location
9:00 am	Free-Standing and Supported Two-Dimensional Materials under Ion Irradiation	Arkady Krasheninnikov¹ (Helmholtz-Zentrum Dresden-Rossendorf¹)	MT05.06.01 (Hynes, Level 2, Room 204)
9:45 am	Interrogation of the Nano-Beam and Nano-Target Effects in Ion Radiation Using IM3D	Yang Yang^1,2, Yong Gang Li³, Michael Shor^t1,Ju Li¹ (Massachusetts Institute of Technology¹, Lawrence Berkeley National Laboratory², Institute of Solid State Physics, Chinese Academy of Sciences³)	MT05.06.03 (Hynes, Level 2, Room 204)
10:30 am	FIB-SIMS—Recent Advances in Secondary Ion Mass Spectrometry for Analytical Dual Beam Focussed Ion Beam Instruments	Johann Michler¹, Lex Pillatsch¹, Agnieszka Priebe¹ (Empa–Swiss Federal Laboratories for Materials Science and Technology¹)	MT05.07.01 (Hynes, Level 2, Room 204)
11:00 am	NanoFab-SIMS—A Promising Tool for the Characterization of Nanofeatures	Christelle Guillermier¹, Brett Lewis¹, Fouzia Khanom¹ (Carl Zeiss SMT, Inc.¹)	MT05.07.02 (Hynes, Level 2, Room 204)
11:30 am	Enhancing Sensitivity with NeFIB-SIMS—A Material and Parameter Study	Brett Lewis¹, Fouzia Khanom¹, Christelle Guillermier¹ (Carl Zeiss SMT Inc¹)	MT05.07.03 (Hynes, Level 2, Room 204)
1:30 pm	Analytical Capabilities on FIB Instruments Using SIMS—Applications, Current Developments and Prospects	Tom Wirtz¹, Jean-Nicolas Audinot¹, Jelena Lovric¹, Alexander Ost¹, Olivier De Castro¹ (Luxembourg Institute of Science and Technology¹)	MT05.08.01 (Hynes, Level 2, Room 204)
2:00 pm	Development of an In Situ Cryo High Resolution Instrument for Multimodal Analysis in Nano-Toxicology	Olivier De Castro¹, Jelena Lovric¹, Rachid Barrahma¹, Olivier Bouton¹, Eduardo Serralta², Nico Klinger², Gregor Hlawacek², Peter Gnauck³, Serge Duarte Pinto⁴, Falk Lucas⁵, Tom Wirtz¹ (Luxembourg Institute of Science and Technology¹,Helmholtz-Zentrum Dresden-Rossendorf²,Carl Zeiss Microscopy GmbH³,Photonis Netherlands B.V.⁴,ETH Zürich⁵)	MT05.08.02 (Hynes, Level 2, Room 204)
2:15 pm	Unveiling Photoinduced Ion Dynamics in Hybrid Organic-Inorganic Perovskites Using Time-Resolved Time-of-Flight Secondary Ion Mass Spectrometry	Yongtao Liu^1,2, Anton Ievlev¹, Liam Collins¹, Nikolay Borodinov¹, Alex Belianinov¹, Matthias Lorenz¹, Stephen Jesse¹, Kai Xiao¹, Mahshid Ahmadi², Bin Hu², Sergei Kalinin¹, Olga Ovchinnikova¹ (Oak Ridge National Laboratory¹,The University of Tennessee, Knoxville²)	MT05.08.03 (Hynes, Level 2, Room 204)

Wednesday - Expand Wednesday - Collapse

Thursday, December 5	Title	Authors	Location
10:30 am	3D Nanoprinting Using Electron and Ion Beams	Jason Fowlkes1, Eva Mutunga2, Robert Winkler3, Jurgen Sattelkow3, Grace Pakeltis2, Philip Rack2, Alex Belianinov1, Olga Ovchinnikova1,Harald Plank3 (Oak Ridge National Laboratory1,The University of Tennessee, Knoxville2,Graz University of Technology3)	MT05.10.01 (Hynes, Level 2, Room 204)
11:00 am	Direct-Writing Nanofabrication of Complex 3D Superconducting Nanostructures	Rosa Córdoba^1,2, Alfonso Ibarra³, Dominique Mailly⁴, Jose De Teresa^2,3 (Molecular Science Institute (ICMol)¹, Aragon Material Science Institute (ICMA)², University of Zaragoza, INA, LMA³, University Paris Saclay, Univ Paris Sud, CNRS, Ctr Nanosci & Nanotechnol⁴)	MT05.10.02 (Hynes, Level 2, Room 204)

Thursday - Expand Thursday - Collapse

Advanced X-ray Sessions

Monday, December 2	Title	Authors	Location
3:45 pm	Emergence of Faceted Spiral Patterns During Eutectic Crystallization	Saman Moniri¹,Hrishikesh Bale²,Tobias Volkenandt³,Yeqing Wang^4,1,Jianrong Gao⁴,Tianxiang Lu¹,Kai Sun¹,Ashwin Shahani¹ University of Michigan¹, Carl Zeiss Microscopy Inc.², Carl Zeiss Microscopy GmbH³, Northeastern University of China⁴	MT06.04.02 (Hynes, Level 2, Room 209)

Monday - Expand Monday - Collapse

{{ country.fda_text }}