Microscopy Events

ZEISS at the Minerals, Metals and Materials Society (TMS) Annual Meeting

March 10 - 14, 2019 - San Antonio, TX, USA, booth #214

We believe in the great power of materials to change our world. In this pursuit of understanding and technical progress, materials researchers need to characterize microstructure. We at ZEISS equip scientists and engineers to build the future.

Metals are a group of complex and versatile materials utilized in an incredible range of applications – from construction, to automotive, energy and consumer goods – each demanding different properties. Accurate measurements at various stages during the manufacturing process help understand how the influencing variables control microstructures, alter composition and introduce impurities.

ZEISS offers a leading-edge portfolio for the metals and steel industry. More than 160 years of experience in optics has laid the foundation for pioneering light, electron, x-ray and ion beam microscopes with superior integration of imaging and analytical capabilities to provide information beyond resolution.

Visit our booth, meet with our experts and learn more.

Booth Demonstrations

ZEISS Axio Observer 7

ZEISS Axio Observer 7

Observe metallographic samples in no time - focus once and keep focus for all other magnifications. Proven optical quality from ZEISS combined with automated components ensures that you get reliable, reproducible results every time. Its modular system allows you to invest only in features you need now and upgrade in the future as your requirements change.

Rapidly and reliably determine non-metallic inclusion content in steels, with support of global standards, automatic detection of rolling direction and field review functionality. ZEISS ZEN NMI is a straightforward and easy-to-use ZEN module compatible with the Axio Observer 7 with full GxP integration possible for auditability and traceability

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ZEISS Primotech

ZEISS Primotech

Investigate birefringent materials with Primotech POL, our petrographic microscope for lab and WiFi digital classroom use. It is equipped with a pre-centered circular rotating stage and polarization components aligned with optical pathways and allows you view your birefingent material under brightfield and cross polarization contrast in either transmitted or reflected illumination.

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ZEISS Stemi 508

ZEISS Stemi 508

Your compact reliable Greenough stereo microscope. View samples with outstanding image contrast and color accuracy with apochromatic optics at an 8:1 zoom. Stemi 508 sets the standard with the most ergonomic design of any other Greenough stereo microscope, allowing comfortable use, even after long hours.

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ZEISS ZEN Intellesis

Advanced image segmentation is also available on all microscope systems using the ZEISS ZEN Intellesis module to extract quantitative data from your micrographs. This data-agnostic user guided machine learning system can automatically segment images – even challenging images that cannot be processed by standard image analysis methods.

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Join our symposium to gain in depth knowledge of current techniques and their applications. There will be a technical session every day from March 11 - 13.

Mapping Grain Morphology and Orientation by Laboratory Diffraction Contrast Tomography

Session: Characterization of Minerals, Metals, and Materials — Characterization Method Development II
Time: Monday, March 11, 4:30 PM
Location: Henry B. Gonzalez Convention Center, 212B

Nicolas Gueninchault1; Florian Bachmann1; Hrishikesh Bale2; Jun Sun1; William Harris2; Steve Kelly2; Christian Holzner1; Erik Lauridsen1. 1 Xnovo Technology Aps; 2 Carl Zeiss Microscopy

Recent developments of the Laboratory Diffraction Contrast Tomography (LabDCT) technique have extended its capabilities to include full reconstruction of the 3D grain structure, including both grain morphology and crystallographic orientation. LabDCT makes use of high resolution diffraction images acquired on a ZEISS Xradia 520 Versa X-ray microscope. The diffraction signals are based on polychromatic X-rays and acquired in a special Laue-focusing geometry that helps increase the signal-to-noise ratio. The 3D crystallographic imaging capabilities of LabDCT complements the structural data obtained by traditional absorption-based tomography and together they provide unprecedented insight into materials structure. We will present a selection of LabDCT results with emphasis on its non-destructive operation. We will discuss boundary conditions of the current implementation, compare with conventional synchrotron approaches, point to the future of the technique and discuss ways in which this can be correlatively coupled to related techniques for better understanding of materials structure evolution in 3D.

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Multiscale 3D investigation of environmental barrier coatings and damage in angle-interlocked ceramic matrix composite under in-situ loading

Session: Micro- and Nanomechanical Testing in Harsh Environments — Micromechanical Testing under Extreme Conditions
Time: Tuesday, March 12, 4:30 PM
Location: Henry B. Gonzalez Convention Center, 217B

Hrishikesh Bale1; Aly Badran2; Robert Ritchie3; David Marshall2. 1 Carl Zeiss X-ray Microscopy; 2 University of Colorado Boulder; 3 University of California, Berkeley

Textile composites with ceramic fiber tows woven into 2D/3D architectures in a ceramic matrix are important material options for many structural applications. These composites represent a new class of integrally woven ceramic-matrix-composites for high-temperature applications, where both strength and thermal conductivity are important. For high-performance and reliability, a key issue is irregularities and defects in the textile reinforcement, which compromise strength and life. Environmental barrier coatings further expand the capabilities for extremely corrosive environments3D x-ray microscopy allows non-destructive imaging and enables subjecting samples simultaneously to in-situ mechanical loading under high-temperature and corrosive environments. We present results from a 3D multi-scale non-destructive investigation performed on a 3-layer angle-interlocked woven composite specimen subjected to in-situ mechanical loading. Results obtained through combination of in-situ image acquisition and image data analysis at the synchrotron and a lab microscope demonstrate the important aspects of CMC’s that were investigated through in-situ testing.

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Nondestructive 3D Analysis of Solid Oxide Fuel Cells by Lab-based X-ray Nanotomography – Towards Computational Integrity

Session: 5th Symposium on Advanced Materials for Energy Conversion and Storage — Energy Conversion with Emphasis on SOFCs II
Time: Wednesday, March 13, 10:45 AM
Location: Henry B. Gonzalez Convention Center, 225A

Stephen Kelly1; Sandrine Ricote2; Alexis Dubois2; William Harris1; John Berger2; Robert Kee2. 1 Carl Zeiss X-ray Microscopy; 2 Colorado School of Mines

Imaging the complex 3D microstructure of fuel cells and similar energy devices has remained challenging. In the “materials by design” framework, imaging provides critical input into performance models that can both explain operation and predict new solutions. Ideally, this imaging can track sample parameters non-destructively across multiple length scales, helping validate and refine these models. We present non-destructive microstructural imaging of a H+-solid oxide fuel cell (or protonic ceramic fuel cell) anode made of BaCe0.2Zr0.7Y0.1O3-d (BCZY)/Ni (prepared by solid-state reactive sintering) using lab-based x-ray nano-tomography. The contrast and 50 nm spatial resolution allows 3D identification of Ni and BCZY phases, pores, and cracks and enables analyses inaccessible through 2D imaging. These include triple phase boundary measurement and plotting crack trajectory, and provide 3D structural input for transport or mechanical simulations. Furthermore, the non-destructive nature allows analysis with complementary techniques (such as SEM or FIB-SEM), or imaging the sample post-processing.

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ZEISS Xradia 610 and 620 Versa

ZEISS Xradia 620 Versa

The new ZEISS Xradia 610 and 620 Versa X-ray microscopes is the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family. Image your specimen non-destructively in true spatial resolution of 500 nm with a minimal achievable voxel size of 40 nm, building on industry-best resolution and contrast. Achieve higher flux and faster scans without compromising resolution. Characterize 3D microstructures over time with in-situ imaging under controlled perturbation in 4D.

Stop by and talk to us to learn about the features and advantages of the new ZEISS Xradia 610 and 620 Versa models!

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