Accelerating 3D Characterization: ZEISS X-ray Microscopy’s Advanced Reconstruction Toolbox

Ravikumar Sanapala
Carl Zeiss X-ray Microscopy
Ravi Sanapala is the Sr. Product Manager at ZEISS X-ray Microscopy. He has more than 10 years of experience in the capital equipment industry working in various applications and product marketing/management roles. Before joining Carl Zeiss, he worked at KLA in the semiconductor industry and led the launch of several successful wafer inspection products. Ravi received an MBA from the Haas School of Business, University of California, Berkeley, and an MS degree from the University of Maryland, College Park. He lives in the San Francisco Bay Area.