Recent Innovations in Focused Ion Beam Microscopy for Materials Science

Fabian Perez-Willard, Ph.D.
Carl Zeiss Microscopy GmbH
Fabián Pérez Willard is Solutions Manager at ZEISS Microscopy. He focuses on microscopy solutions for the area of nanoscience and nanomaterials. Fabián studied physics at the Karlsruhe Institute of Technology (KIT), where he completed a Ph.D. in low-temperature physics in 2003. After heading a multiuser service lab facility with focus on the fabrication and characterization of functional nanostructures at KIT, Fabián moved to ZEISS in 2006. At ZEISS he has held different positions in applications, product management, and marketing. Fabián has 20+ years of experience in electron microscopy and is an expert in the field of ion microscopy.