Discover ZEISS at Materials Research Conferences

IMAT and MS&T

One thing that remains consistent this year is finding ways to continue research in our ever-changing working environments.

ZEISS will be attending two materials research shows in the coming months. 

  • IMAT
    September 13 - 17, 2021 | St. Louis, MO, USA | Booth #410
  • MS&T
    October 17 - 21, 2021 | Columbus, OH, USA | Booth #701

ZEISS is your partner to help you find your next breakthrough and is delivering new innovations to support you. Spend some time in our booth and learn about what’s new and sign up for a live remote demo with our product experts.

Featured Products

ZEISS LSM 900 for Materials

Your Versatile Confocal Microscope for Advanced Imaging and Surface Topography

ZEISS GeminiSEM 560

Imaging Below 1kV. Expert Knowledge Integrated.

ZEISS Xradia 620 Versa

3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples

Presentations

at IMAT

Monday, September 13, 2021

1:20 pm

Microstructural Characterization II-a

Correlative light, electron and in situ Raman imaging of modern and historic railway tracks, linking wear and corrosion behavior to microstructure and composition

Andy Holwell, Carl Zeiss Microscopy Ltd, Cambridge, United Kingdom

Rail track metallurgy and cross-sectional profile have evolved since the early
twentieth century to meet ever more demanding requirements of wear resistance, hardness and durability, in order to cope with increasing demands of speed, weldability and rolling contact performance. The microstructure is engineered to have high hardness, resistance to rolling contact fatigue and durability to environmental degradation.

Mechanical and corrosion damage in worn 1930s and 1950s rails were compared
against unused but environmentally corroded modern rail. Multimodal correlative microscopy and in situ Raman spectroscopy allowed qualitative evaluation of deformation and corrosion mechanisms, against differences in metallurgy and microstructure such as inclusion content, grain size, crystal phase, decarburization and wear.

In-situ correlative Raman imaging was carried out in a field emission scanning
electron microscope, correlated with multiple contrast methods in light microscopy, high resolution secondary electron imaging and energy-dispersive x-ray spectroscopy. Light microscopy, EDS and Raman were used together to
characterize the microstructure, oxides and inclusions in each rail, localized to
specific regions of mechanical damage. This provided a correlation between regions of high wear and deformation with the corrosion species and the contemporary composition of the rail steels. The integration of a Raman microscope in the chamber of the SEM uniquely allows rapid correlative workflows and overlay of spectra with optical and electron imaging.

Monday, September 13, 2021

1:40 pm

Perspectives for Emerging Materials Professionals

Out of the Lab and into the Light

Kyle Crosby, Carl Zeiss Microscopy, LLC, White Plains, NY

The journey from career student to career professional involves navigating a complex set of philosophical and practical dilemmas. This transition has many potential avenues to success, with an equal number of pitfalls to failure along the way. Having the opportunity to learn from the experiences of others is invaluable and should be accepted with an open mind, but not without critical thought as to how it might affect personal priorities. Anecdotes of both triumph and defeat will be shared to help guide the next generation “out of the lab and into the light”.

Tuesday, September 14, 2021

10:00 am

Non Destructive Testing

Use of X-ray Tomography to Guide Data Acquisition in FA Workflows

Dr. William M. Harris, Carl Zeiss Microscopy, LLC, White Plains, NY

For failure analysis workflows and considering imaging techniques alone, a selection of optical and electron systems with associated analytical capabilities exist, as well as 2D or 3D X-ray imaging. Of these methods, X-ray maintains the notable strength of nondestructive operation, while being able to provide a description of interior, subsurface features.
As modern industrial X-ray tomography evolved from medical CT, initial resolution was quite low, limited primarily by X-ray source and detector technologies. Over the past 2 decades these have evolved substantially, and the capabilities of X-ray CT, microCT, and X-ray microscopy have improved accordingly. Nonetheless, for some types of materials structures (and correspondingly, failures) the X-ray resolution can be lacking – able to identify gross defects or features critical to the failure, but not a thorough or conclusive description. As a result, X-ray imaging is found typically as the first step of a workflow, providing a non-invasive overview before extracting targeted regions for higher resolution work.

This talk will cover a brief survey of the X-ray imaging tools at our disposal as well as their particular strengths (dimensional measurement, resolution requirements, sample size considerations, etc.). This will include ‘Resolution at a Distance’ technology, a unique capability achieving high resolution imaging even within ‘large’ parts. Examples will be drawn from metal alloy systems, additive manufactured parts, composite materials, energy devices, and microelectronics to demonstrate the role of X-ray to observe features including: internal porosity, cracks, inclusion/defect particles, delamination, and surface texture. Emphasis will be placed on the ability to navigate between length scales both within X-ray but also looking to higher resolution, albeit destructive, imaging techniques downstream. The talk will also briefly touch on the idea of 4D in situ imaging as a means to pre-emptively predict failure modes.

Wednesday, September 15, 2021

8:00 am

Tools & Techniques

Extremely rapid ablation and in situ EBSD preparation using a femtosecond laserin the FIB-SEM

Andy Holwell, Carl Zeiss Microscopy Ltd, Cambridge, United Kingdom

When carrying out studies of crystallography, internal strain and failure using electron backscatter diffraction (EBSD), the time-limiting factors are a combination of the speed of the EBSD detector and the time required for sample preparation – for example by vibratory polishing or focussed ion beam (FIB) polishing in-situ. The use of a femtosecond laser facilitates extremely fast sample machining and surface preparation with a small heat affected zone, precisely locating, extracting and preparing specific regions of interest.

The integration of an airlock-mounted femtosecond laser ablation chamber on the FIB-scanning electron microscope not only allows extremely rapid laser milling and access to deeply buried structures and features, but also the preparation of a surface suitable for EBSD without further time-consuming FIB milling. We further elucidate a method for this rapid single-stage preparation and show several examples of metal surfaces suitable for EBSD grain mapping, rapidly prepared using the femtosecond laser – including machining out a large region around the surface of interest to enable the appropriate electron beam and detector geometry for EBSD.

The total preparation time for each surface was under 5 minutes. While ripple-like laser induced periodic surface structures (LIPSS) are visible on the prepared surface, these do not significantly affect the quality of the EBSD pattern obtained and were minimised during method development. Focused ion beam polishing, conducted in-situ without the sample ever leaving the microscope vacuum, can further improve the surface quality while still keeping preparation time extremely short.

Presentations

at MS&T

Monday, October 18, 2021

3:50 pm

Integration between Modeling and Experiments for Crystalline Metals: From Atomistic to Macroscopic Scales III — Session II

Lab-based Diffraction Contrast Tomography: Achieving Large Volume Grain Statistics for Full Field Modeling of Polycrystalline Materials

Jun Sun1; Jette Oddershede1; Florian Bachmann1; Hrishikesh Bale2; William Harris3; Erik Lauridsen
1 Xnovo Technology; 2 Carl Zeiss X-ray Microscopy; 3 Carl Zeiss Microscopy, LLC

Tuesday, October 19, 2021

11:00 am

Grain Boundaries, Interfaces, and Surfaces in Ceramics: Fundamental Structure—Property— Performance Relationships — Poster Session

A Novel Probe for Grain Boundary Characterization on the Mesoscopic Scale: Lab-based Diffraction Contrast Tomography

Jun Sun1; Jette Oddershede1; Florian Bachmann1; Hrishikesh Bale2; William Harris3; Erik Lauridsen
1 Xnovo Technology; 2 Carl Zeiss X-ray Microscopy; 3 Carl Zeiss Microscopy, LLC

Tuesday, October 19, 2021

3:00 pm

Advances in Ferrous Metallurgy — Developments in Testing and Processing

3D Non-destructive Characterization of Texture Evolution in Electrical Steels with Lab-based Diffraction Contrast Tomography

Jun Sun1; Jette Oddershede1; Florian Bachmann1; Hrishikesh Bale2; William Harris3; Erik Lauridsen
1 Xnovo Technology; 2 Carl Zeiss X-ray Microscopy; 3 Carl Zeiss Microscopy, LLC

Wednesday, October 20, 2021

4:30 pm

Materials Informatics for Images and Multidimensional Datasets — Session II

Computational or Experimental? Interpreting X-ray Absorption and Diffraction Contrast for Massive Non-destructive 3D Grain Mapping of Metals in Laboratory CT

Andy Holwell, Carl Zeiss Microscopy Ltd, United Kingdom (presenting author)
Hrishikesh Bale, Carl Zeiss Microscopy Inc, USA

Laboratory 3D X-ray microscopy (XRM) has previously been limited to imaging via material density differences within the sample. As such, single-phase polycrystalline materials (e.g. alloys) do not exhibit any absorption contrast to reveal the underlying grain microstructure. For microstructural crystallography, researchers have turned to time-consuming 3D electron backscatter diffraction in the scanning electron microscope in metallurgy, ceramics, semiconductors, pharmaceuticals, geology etc.

Now, laboratory-based diffraction contrast tomography (DCT) can extract crystallographic information from single-phase polycrystalline samples, non-destructively and in three dimensions. DCT scans collect x-ray diffraction patterns which are deconvoluted for crystallographic reconstruction. Information on grain morphology, orientation, size and centroid position is available from the reconstructed 3D grain map, for studies of grain growth, tensile testing and aniostropy, delivering explicit grain structures for modeling.

We show how LabDCT provides a routine solution for experimentally acquiring expli

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IMAT & MS&T 2021 - Materials Research Snap Content