Dr. Hrishikesh Bale is the Market Solutions Manager for Engineering Materials at ZEISS Microscopy. He has been working in the area of advanced composites and structural materials for over 20 years. His research focus lies in advanced materials characterization using in situ micro and nano-mechanical testing using X-ray computed tomography. He also specializes in new applications development for laboratory 3D X-ray diffraction imaging techniques both at micro and nano scale. Before joining Carl Zeiss Microscopy in 2014, he held a joint post-doctoral scholar appointment at Lawrence Berkeley National Laboratory and UC Berkeley in the Material Science and Engineering department working as part of the National Hypersonics Science Center, imaging advanced CMC materials under in situ high-temperature conditions. He received his Ph.D. in Materials Science from Oklahoma State University in 2010 with a focus on microscale residual stress determination using Synchrotron Laue Microdiffraction techniques. He lives in the San Francisco Bay Area.