ZEISS at Microscopy & Microanalysis (M&M) 2022
Power of Possibilities
August 1 - 4, 2022
Booth #1018
As researchers, you wield curiosity to create an ever-changing world. Your discoveries present a need for our society to adopt and adapt to that new understanding. Throughout the past two years we have all been finding new ways to adapt to the changing times. We all jumped into a world of digital efficiencies. We have encountered new ways to work, new avenues for interpersonal connections, new approaches to previous hurdles. As your partner, we have used that drastic change to recalibrate how we serve you.
This year, at M&M 2022, we are bringing those digital efficiencies to our in-person booth with an eye on sustainability. Come and interact with researcher discoveries in our interactive wall, see our products in a VR showroom, or remote into our ZEISS Microscopy Customer Center for a live product introduction. Register for our in-booth presentations to hear from researchers like you, who have surmounted the challenges of the last two years to find their discoveries. We believe that you are the power behind what’s possible, let us help you find efficiencies to achieve your discoveries, faster.
Connect with ZEISS for In-Booth Educational Presentations
Each day has a chance to connect, be sure to add it into your schedule.
Monday, August 1
12:00 pm - 1:00 pm
Getting Sensitive with the SEM: High Resolution Backscatter Detection in Ultrastructural Cell Biology

Ian White, Ph.D.
Deputy Electron Microscopy Manager
Laboratory for Molecular Cell Biology at University College London
Tuesday, August 2
12:00 pm - 1:00 pm
Leveraging X-ray Microscopy Technology at University of Michigan’s (MC)2 Facility: Case Studies in Engineering

Nancy Muyanja, PhD
X-ray & Electron Microscopy Specialist
Michigan Center for Materials Characterization
University of Michigan
Tuesday, August 2
5:45 pm - 6:45 pm
Multi-length Scale Characterization of High-𝛾’ Ni-base superalloys Processed Through Electron Beam Melting for Critical Rotating Applications

Michael Kirka, PhD
Research Materials Scientist
Oak Ridge National Laboratory
Wednesday, August 3
12:00 pm - 1:00 pm
A New Era of FIB-SEM for Materials Research and Correlative Microscopy

Stephen T. Kelly, Ph.D.
Energy Materials Solutions Manager
ZEISS

Cheryl Hartfield, MA, FASM
Product Marketing Manager
Materials Research & Electronics, Crossbeam
ZEISS
Wednesday, August 3
5:45 pm - 6:45 pm
A thousand and one slices: Freedom to explore with the focused ion beam scanning electron microscope

Anna Steyer, PhD
Cryo Electron Tomography Specialist
Imaging Centre
European Molecular Biology Laboratory
Live Microscopy Workflows at M&M
Connect Directly to our ZEISS Microscopy Customer Center
In this new era of virtual interaction, while we are excited to see you face to face, as part of a commitment to sustainability ZEISS has chosen not to ship instrumentation to M&M this year. We are excited to offer you an engaging and interactive alternative by connecting directly with our microscopes and applications experts in California, directly from the tradeshow floor.
Browse the 7 microscopy workflows we're showcasing at the booth and fill out the form below to request a session.