ZEISS at Microscopy & Microanalysis (M&M) 2022

Power of Possibilities
August 1 - 4, 2022
Booth #1018

As researchers, you wield curiosity to create an ever-changing world. Your discoveries present a need for our society to adopt and adapt to that new understanding. Throughout the past two years we have all been finding new ways to adapt to the changing times. We all jumped into a world of digital efficiencies. We have encountered new ways to work, new avenues for interpersonal connections, new approaches to previous hurdles. As your partner, we have used that drastic change to recalibrate how we serve you.

This year, at M&M 2022, we are bringing those digital efficiencies to our in-person booth with an eye on sustainability. Come and interact with researcher discoveries in our interactive wall, see our products in a VR showroom, or remote into our ZEISS Microscopy Customer Center for a live product introduction. Register for our in-booth presentations to hear from researchers like you, who have surmounted the challenges of the last two years to find their discoveries. We believe that you are the power behind what’s possible, let us help you find efficiencies to achieve your discoveries, faster.


Connect with ZEISS for In-Booth Educational Presentations

Each day has a chance to connect, be sure to add it into your schedule.

Monday, August 1

12:00 pm - 1:00 pm

Getting Sensitive with the SEM: High Resolution Backscatter Detection in Ultrastructural Cell Biology

For years backscatter SEM techniques have been evolving to replicate TEM levels of resolution without TEM related restrictions on section size and the difficulty of collecting significantly long section series for 3D data acquisition. SEM array tomography of many hundreds of serial sections is now routinely possible and yields resolution and image quality sufficient for almost all cell biology projects, meaning that imaging time rather than resolution is often the limiting factor in SEM vs TEM choice. Recent improvements including the new ZEISS Sense backscatter detector have significantly reduced imaging times whilst improving image quality, making backscatter SEM imaging faster and thus more accessible to users, allowing rapid collection of bigger areas or 3D datasets and higher throughput. We show several examples of how SEM array tomography has been used in varying large area, 3D and correlative light and electron microscopy projects to attain data previously unachievable with TEM in our Institute.

Ian's Bio
Having completed my PhD at the University of Leeds and a postdoctoral position at the University of Sheffield, I moved to University College London (UCL) in 2002 where I began to learn the techniques involved in biological electron microscopy. After over five years of dedicating increasing time to mastering these skills for Transmission Electron Microscopy (TEM), including prep techniques, correlative light and electron microscopy (CLEM) and serial section cutting and imaging I joined the EM Unit at the Laboratory for Molecular Cell Biology (LMCB) at UCL in 2008. Now a dedicated cell biological electron microscopist I support the needs of researchers at the LMCB and beyond in all their EM research on cells, tissues and model organisms, focussing on the most technically demanding CLEM, and 3D EM projects. In 2020 we branched out into Scanning Electron Microscopy (SEM), specifically array tomography, to extend our ability to image large areas in X Y and Z, and have been developing methods to make this more routinely possible and accessible for all EM users.

Ian White, Ph.D.
Deputy Electron Microscopy Manager
Laboratory for Molecular Cell Biology at University College London

Tuesday, August 2

12:00 pm - 1:00 pm

Leveraging X-ray Microscopy Technology at University of Michigan’s (MC)2 Facility: Case Studies in Engineering

3D X-ray microscopy (XRM) has rapidly evolved as a leading technique for 3D non-destructive microstructure investigations for a wide variety of material systems. As a core research facility at the University of Michigan’s College of Engineering, the Michigan Center for Materials Characterization (MC)2 provides support for scientific research at micro, nano, and atomic length scales to scientists in academic, government and industry settings. The XRM user base at (MC)2 has grown significantly in the last four years in part because of the rise in 3D printing that has accelerated research into defect behavior in 3D printed parts and the expansion of research and development budgets into battery materials for electric vehicle applications.

In this talk, I will provide insights into how our users have utilized the Xradia 520 Versa powered by ZEISS, for applications spanning aerospace, biomedical and material science engineering. These include failure analysis in composite materials, defect initiation and growth in additively manufactured alloys, 4D studies of grain growth in metallic alloys, and developing novel tools for pre-clinical efficacy testing of percutaneous devices. The multidisciplinary nature of these applications makes the case for wide adoption of laboratory X-ray microscopes in a broad range of industries.

Nancy's Bio
Nancy S. Muyanja received her B.S. degree in Electrical Engineering from Makerere University in 2010 and her M.S. and Ph.D. degrees in Electrical Engineering (2014) and Applied Physics (2017) respectively from the University of Michigan. As a postdoctoral researcher in the department of Material Science and Engineering at the University of Michigan, Nancy employed synchrotron X-ray tomography in 4D to study the solidification dynamics of icosahedral quasicrystals in situ from the liquid phase. During her postdoc tenure, she joined the staff at the Michigan Center for Materials Characterization as an Instrument Scientist and officially accepted a full-time role with the facility in 2019. Nancy is a past recipient of the Schlumberger and AAUW fellowships and a 2020 recipient of the College of Engineering staff excellence award.

Nancy was featured in our 3D in 3 Minutes campaign

Nancy Muyanja, PhD
X-ray & Electron Microscopy Specialist
Michigan Center for Materials Characterization
University of Michigan

Tuesday, August 2

5:45 pm - 6:45 pm

Multi-length Scale Characterization of High-𝛾’ Ni-base superalloys Processed Through Electron Beam Melting for Critical Rotating Applications

Additive manufacturing offers the ability to rapidly fabricate prototype geometries and novel components not manufacturable by traditional manufacturing means. However, the potential for cracks or defects presents substantial hazard under real service conditions – a hazard for which the microscopy toolset can help illuminate and lead to mitigation strategies. This talk presents a case study in using advanced microscopy to address difficult AM challenges. Defect prone and traditionally non-weldable materials such as the high-𝛾’ nickel-base (Ni-base) superalloys present a high-risk high reward opportunity for AM techniques such as laser or electron beam fusion powder bed. This is due to the use of these materials in some of the most critical applications and extreme environments such as turbine blades. However, fusion-based metal AM processes are largely similar to welding processes and result in similar material cracking issues during processing. Leveraging characterization techniques spanning computed tomography (CT) to electron microscopy, coupled with computational modeling and in-situ process monitoring on the electron beam melting (EBM) AM printer, the relationship between processing conditions and material structure can be established for producing crack free material. Further, through robust characterization approaches, stochastic defects that form within materials fabricated using optimized processing conditions can be shown ultimately to be deterministic. Ultimately, developing these relationships enabled the demonstration that turbine blades could be fabricated from a non-weldable Ni-base superalloy Inconel 738 and have the material quality and mechanical properties necessary to survive the extreme thermal and rotating conditions of a land based turbine.

Michael's Bio
Dr. Michael Kirka is the Group Leader of the Deposition Science and Technology Group and Senior Research Staff at Oak Ridge National Laboratory (ORNL). His research interests are in the fields of process-structure-properties and high temperature materials for critical and harsh applications. For the past eight years Michael has been a member of the DS&T group and building a team focused on materials for extreme environment processed through additive manufacturing at ORNL’s Manufacturing Demonstration Facility (MDF). In this time, the team that he has formed has been instrumental in developing the process science necessary to enable materials of ever-increasing operational capabilities, which are ever more difficult to process due to defects such as non-weldable nickel-base superalloys and refractory alloys. Michael’s current research focuses on developing and understanding the limitations in the processing science for high temperature materials such as nickel-base (Ni-base) superalloys and refractory metals for additive manufacturing processes through understanding their microstructural evolution and resultant process-structure-property relationships. Michael has further focused on understanding the long-term mechanical behavior and degradation mechanisms in AM materials similar to those observed during service. Program successes of the team include the fabrication, certification and qualification, and engine demonstration of the first full set of AM fabricated airfoils for a land-based turbine engine, developing the processing science for materials in polycrystalline, columnar, and single crystal textures through AM for increased materials performance, and demonstration of processing of defect free molybdenum for thermal propulsion system core applications. Michael joined ORNL in 2014 as a post-doctoral fellow. Michael earned his B.S. in materials science and engineering in 2007 from The University of Michigan, and M.S. and Ph.D. degrees from The Georgia Institute of Technology in mechanical engineering in 2010 and 2014. In 2021 Michael was recipient of TMS’ Young Innovator for Additive Manufacturing Research Award.

Michael Kirka, PhD
Research Materials Scientist
Oak Ridge National Laboratory

Wednesday, August 3

12:00 pm - 1:00 pm

A New Era of FIB-SEM for Materials Research and Correlative Microscopy

New materials and technological advances are being developed at rates faster than ever before, enabled by the emergence of new microscopy techniques, such as fs-laser integrated with FIB-SEM, artificial intelligence in microscopy workflows, image-based simulation, and correlative microscopy. Faster insights are being enabled across diverse materials science applications, including battery characterization, semiconductor failure analysis, and structural analysis of metals and alloys. Part 1 of this talk will showcase the newest capabilities of ZEISS Crossbeams and a variety of application examples across different research and industry segments, including those benefitting from new and emerging correlated microscopy workflows.

Part 2 will specifically consider strategies for 3D FIB tomography data acquisition to enable accurate materials simulation. For this application, acquiring image data that can feed simulations and reproduce real material properties is challenging and relies on satisfying several conditions. For example, the volume must be representative of the “bulk” material microstructure. The (2D) image resolution must capture the relevant scope of material features, and the 3D image must accurately represent the material in all 3 dimensions and at appropriate length scales. We present here a review of the factors and experimental recommendations for best employing FIB tomo for such data collection, using a lithium-ion battery cathode as a test case to demonstrate the approach.

Steve's Bio
Stephen Kelly is the Market Sector Manager for Energy Materials at Carl Zeiss RMS. He has been working in the battery and energy materials space for over 20 years and has extensive experience with materials characterization and fabrication across the energy space. His expertise covers batteries, fuel cells, hydrogen storage materials, and photovoltaics, among others. After receiving his BS in Engineering Physics from Colorado School of Mines in 2002, he went on to receive his Ph.D. in Materials Science and Engineering from Stanford University in 2009. He spent 4 years working as a postdoc at Lawrence Berkeley National Laboratory specializing in x-ray microscopy of solar cells and atmospheric aerosols. He has been working at Carl Zeiss RMS for the last 7 years as an imaging specialist and Sector Manager for the Energy Materials market. He lives in San Francisco, California.

Cheryl's Bio
Cheryl is the product marketing manager for Crossbeam in materials research and electronics (MRE) industries in North America. She received her MA and BS in Microbiology from UT Southwestern Medical Center, and Texas A&M, respectively. She has >25 years of electron microscopy experience across life science, materials science and semiconductors. She was elected Senior Member Technical Staff at Texas Instruments, is a Fellow of ASM, and co-founded Omniprobe to transform the world of TEM sample preparation. She has 15 patents and authored >70 papers including 3 best presentation awards. She received the 2020 EDFAS President’s Award for exceptional service to the Electronic Device Failure Analysis Society.

Stephen T. Kelly, Ph.D.
Energy Materials Solutions Manager

Cheryl Hartfield, MA, FASM
Product Marketing Manager
Materials Research & Electronics, Crossbeam

Wednesday, August 3

5:45 pm - 6:45 pm

A thousand and one slices: Freedom to explore with the focused ion beam scanning electron microscope

In recent years, focused ion beam scanning electron microscopy (FIB-SEM) has emerged as a flexible method that enables semi-automated volume acquisition at the ultrastructural level. The FIB-SEM has been used for acquiring volume data of resin embedded specimens to look at a zoo of specimens at isotropic resolution, addressing new and revisiting old questions. On the other hand, volume data acquisition is also possible at cryogenic temperatures where we can then try to understand the native architecture of organelles or cell-cell interactions in our samples of interest. In the last few years, the FIB-SEM has become increasingly important for sample preparation to allow preparation of thin windows (lamellae) through samples, followed by high-resolution transmission electron microscopy in order to look at proteins at close to atomic resolution in their native environment. I would like to show you different workflows on a variety of samples and projects to demonstrate the capabilities of the FIB-SEM. Covering everything from resin embedded cells, to mouse nerves, from cryo-lamella preparation, to cryo volume imaging using correlative light and electron microscopy on giant bacteria.

Anna's Bio 
I studied Technical oriented biology in Stuttgart (Germany) and worked during my diploma thesis in the lab of Christian Schlieker at Yale university (USA). During my PhD in the lab of Yannick Schwab at the European Molecular Biology Laboratory (EMBL) I was working on new strategies for improved throughput and targeting precision in correlative light and electron microscopy. This was followed by a postdoc in the Electron Microscopy Core Unit at the Max-Planck-Institute of Experimental Medicine in Göttingen with Wiebke Möbius, where I have been studying myelin and axo-glial interactions utilizing volume scanning electron microscopy. Since the beginning of last year I have started working back at the newly build EMBL Imaging Centre in the electron microscopy unit with Simone Mattei, focusing on cryo applications. This is including cryo-tomography, cryo-lamella preparation as well as cryo-volume imaging using focused ion beam scanning electron microscopy in combination with cryo-light microscopy.

Anna Steyer, PhD
Cryo Electron Tomography Specialist
Imaging Centre
European Molecular Biology Laboratory

Live Microscopy Workflows at M&M

Connect Directly to our ZEISS Microscopy Customer Center

In this new era of virtual interaction, while we are excited to see you face to face, as part of a commitment to sustainability ZEISS has chosen not to ship instrumentation to M&M this year. We are excited to offer you an engaging and interactive alternative by connecting directly with our microscopes and applications experts in California, directly from the tradeshow floor. 

Browse the 7 microscopy workflows we're showcasing at the booth and fill out the form below to request a session.

Making High Powered FESEM Accessible to Both the Experienced and Novice User
Gain an introduction to the intuitive user interface of Sigma 300 with SmartSEM Touch and how it can help users of all skill levels arrive at excellent results quickly.
Flexible and Efficient High Resolution Imaging and Analytics
Experience the GeminiSEM 460 field emission SEM's ability to quickly address both imaging and analytical needs of material and biological samples.
Pushing the Limits of Challenging Samples with Low kV FESEM
Discover how easy it is to perform surface-sensitive, distortion-free imaging of your most challenging samples with ZEISS GeminiSEM 560 FESEM.
Putting the Synchrotron Beamline in Your Lab with Nondestructive 3D X-ray Microscopy
Experience 3D X-ray microscopy for faster sub-micron imaging of intact samples with the easy-to-follow, workflow-guided user interface of ZEISS Xradia 620 Versa.
Extending the Lengthscales of FIB-SEM Operation with Integrated fs-laser Ablation
Learn how ZEISS Crossbeam 550 allows you to gain rapid access to deeply buried regions for material characterization.
Navigating Through Lengthscales and Perspectives - Connecting Your Microscopy Data with ZEN Connect
ZEN Connect lets you combine multiple perspectives of your sample across scales and imaging modalities. Experience the unique insights gained by overlaying and organizing your images from the light and electron microscope.
Keeping Your Cool: How to Efficiently Assess the Quality of Your Cryo Samples and Localize Promising Regions of Interest
Learn how to screen your grids for ice contamination and acquire high resolution, sub-cellular fluorescence data with ZEISS Cryo LSM 900 with Airyscan.