ZEISS XRM University

This workshop is an introductory course for users of ZEISS Xradia Versa X-ray microscopes focused on electronics samples. This is a 3-hour workshop with a short break during which participants conduct optional hands-on operation on their own instruments.

Topics that will be covered in this workshop include:

1. Best practices for sample mounting for electronic devices and packages: selecting the best sample holders and positioning your region of interest or fault within the field of view
2. Scout and Zoom: a multiscale 3D imaging approach to navigate and visualize your region of interest
3. Optimizing scan parameters for data quality and speed: sample rotation angle, drift correction, number of projections, intensity, and high aspect ratio tomography (HART)
4. Optimizing results using manual reconstruction: center shift and beam hardening corrections
   
   15-minute break
   
   
5. Q & A
   

The attendees are expected to be familiar with the general procedure of setting up tomography scans on Xradia Versa.

• XRM users focused on electronic device characterization, semiconductor package development or failure analysis
  - Active users of ZEISS Xradia Versa instruments
  - Infrequent Versa users in need of a refresh on scan setup and optimization
  - Lab managers or technicians looking to improve their own skill level to better support and/or train other users of the instrument
  

• Have an improved understanding of best practices for sample and scan setups focused on electronics
• Improve their parameter selection to optimize the quality and throughput of their Versa scan
• Be able to efficiently navigate within their sample to accurately target the correct region of interest for high resolution scanning