This workshop is an introductory course for users of ZEISS Xradia Versa X-ray microscopes focused on electronics samples. This is a 3-hour workshop with a short break during which participants conduct optional hands-on operation on their own instruments.
Topics that will be covered in this workshop include:
- Best practices for sample mounting for electronic devices and packages: selecting the best sample holders and positioning your region of interest or fault within the field of view
- Scout and Zoom: a multiscale 3D imaging approach to navigate and visualize your region of interest
- Optimizing scan parameters for data quality and speed: sample rotation angle, drift correction, number of projections, intensity, and high aspect ratio tomography (HART)
- Optimizing results using manual reconstruction: center shift and beam hardening corrections
- Q & A
The attendees are expected to be familiar with the general procedure of setting up tomography scans on Xradia Versa.
- XRM users focused on electronic device characterization, semiconductor package development or failure analysis
- Active users of ZEISS Xradia Versa instruments
- Infrequent Versa users in need of a refresh on scan setup and optimization
- Lab managers or technicians looking to improve their own skill level to better support and/or train other users of the instrument
After completion of this workshop, attendees should
- Have an improved understanding of best practices for sample and scan setups focused on electronics
- Improve their parameter selection to optimize the quality and throughput of their Versa scan
- Be able to efficiently navigate within their sample to accurately target the correct region of interest for high resolution scanning
Spots are limited.
Access to a Versa system before and after the training is strongly recommended