ZOYC Online

ZEISS On Your Campus (ZOYC) Online is comprised of a live online webinar with your local account team.

ZOYC Online has three main goals:
1. Provide education focused on better utilization of your current microscopy equipment, which can lead to:

Higher quality imaging and faster time to results
A better understanding of the data that are collected
Improved experimental design

2. Bring awareness of new and emerging microscopy trends and technologies.

3. Connect live with your local ZEISS account team.

This live event is presented by your local ZEISS team

Geoff Perumal, EM/XRM Specialist Academia Life Science

Geoff Perumal
EM/XRM Specialist Academia Life Science

Geoff Perumal has been with ZEISS for over 3 years, serving as the EM and XRM Specialist for all Academic Biological accounts in the Eastern US. He specializes in correlative microscopy, 3DEM, and biological EM sample preparation. Prior to joining ZEISS, Geoff worked for 10 years as an EM Tech in the dual EM-LM Core Facility at Albert Einstein College of Medicine, in the Bronx, NY. During his tenure at Einstein, he mastered SEM and TEM operation, cryo and room temperature ultramicrotomy, and cryo and room temperature EM sample preparation. Please consider Geoff a resource for any and all EM troubleshooting, as well as a POC for any ZEISS EM related questions.

Learn about the full program & descriptions of live webinars to be delivered over the next few weeks.

3D SEM – Large Volume Electron Microscopy Enables Robust Statistical Analysis

June 3, 2020 | 1:00 pm EDT

3D SEM techniques have been around for over a decade. Today’s talk will briefly look at the different 3DEM techniques and highlight the strengths of each technique turning 3DSEM data into answers beyond of reach of other life science modalities. In addition, we will couple those strengths and match them to applications considering, data volume, slice thickness, and axial resolution. The talk will also cover automating sample prep as well as data segmentation and analysis to help realize statistical analysis generated from large volumes of serial images at electron microscopy resolution, the power of 3DSEM.

Join this webinar and learn how the ZEISS 3D SEM solutions can help you:

Understand where 3DSEM techniques fit in comparison to traditional TEM and 3D LM techniques
Choosing a ZEISS 3DSEM imaging solution that best fits your needs
Learn about automated segmentation options and how they help enhance statistical robustness

{{ country.fda_text }}