ZOYC Online

ZEISS On Your Campus (ZOYC) Online is comprised of a live online webinar with your local account team.

ZOYC Online has three main goals:
1. Provide education focused on better utilization of your current microscopy equipment, which can lead to:

  • Higher quality imaging and faster time to results
  • A better understanding of the data that are collected
  • Improved experimental design

2. Bring awareness of new and emerging microscopy trends and technologies.

3. Connect live with your local ZEISS account team.

This live event is presented by your ZEISS team

Jeffrey Streger
Material Research Sales Specialist

Residing in the great State of New Jersey, Jeff has been in Electron Microscopy for over 30 years. A Navy veteran, former ZEISS Field Service Engineer, and Penn State graduate, he is the owner of Rave Scientific and the authorized Central Atlantic Account Manager for ZEISS Electron, Particle Beam and 3D X-ray Microscopes in New York City, New Jersey, Delaware, Maryland, DC, West Virginia and Virginia. In his role he will be serving government, industrial and academic customers.

Dr. Hrishikesh Bale
Market Solutions Manager for Engineering Materials

Dr. Hrishikesh Bale is the Market Solutions Manager for Engineering Materials at ZEISS Microscopy. He has been working in the area of advanced composites and structural materials for over 20 years. His research focus lies in advanced materials characterization using in-situ micro and nano-mechanical testing using X-ray computed tomography. He also specializes in new applications development for laboratory 3D X-ray diffraction imaging techniques both at micro and nano-scale. Before joining Carl Zeiss Microscopy in 2014, he held a joint post-doctoral scholar appointment at Lawrence Berkeley National Laboratory and UC Berkeley in the Material Science and Engineering department working as part of the National Hypersonics Science Center, imaging advanced CMC materials under in-situ high temperature conditions. He received his Ph.D. in Materials Science from Oklahoma State University in 2010 with a focus on Microscale Residual Stress determination using Synchrotron Laue Microdiffraction techniques. He lives in the San Francisco Bay Area.

Lighter, Faster, and Stronger: Characterizing Advanced Engineering Materials

July 1, 2020 | 2:00 pm EDT

Speakers: Will Harris & Hrishikesh Bale

Part 3 of the series on Engineering Materials will shift the focus from metals and alloys to research in other advanced materials systems. Particular focus will be placed on structural composites of several types, including fiber-based composites, ceramic matrix composites, and cementitious building materials. In these multi-phase systems, the heterogeneous and often complex microstructures provide opportunities for carefully tuning properties and performance, allowing for strong yet lightweight alternatives in critical applications. However, these complexities also pose a number of characterization challenges. This webinar will begin by introducing relevant applications of light and electron microscopy, and then present several extended case studies using 3D X-ray microscopy, along with multiscale and in situ approaches, to better understand the links between microstructure and material performance in composites.

Key learning objectives include:

  • The challenges faced in imaging and characterizing composite material systems
  • Ways to apply microscopy to understand the effects of their typically heterogeneous structures across length scales and multiple dimensions (2D, 3D, 4D), especially using X-ray microscopy for nondestructive visualization of internal features
  • Associated image processing, visualization, and quantification examples