ZEISS XRM Series Workshop
January 14 - 16, 2020 - ZEISS Microscopy Customer Center Bay Area
This workshop is designed for current users of Versa 3D X-ray Microscopes who are looking for getting more in-depth knowledge of advanced features.
See below for an outline of the 3-day workshop and to register for the workshop. Space is limited.
XRM Workshop Day 1
- Start like a pro: sample preparation and parameter selection
- It’s all about reconstruction: How to get the most out of the raw data
- RaaD™ is Rad: Scout and Zoom and High Resolution considerations
- Go beyond normal: non-standard imaging methods
XRM Workshop Day 2
- Imaging artifacts: how to identify and minimize them
- Optimizing the scans through advanced features: Variable Exposure, HART™, Phase Contrast, Wide Field, and Vertical Stitching
- CT Scaling: how and when to use it
- Explore your data: Introduction to Data Explorer
XRM Workshop Day 3 (Optional)
- Add a µ-CT to my XRM: Flat Panel detectors and how to use them
- Dual Energy Scans: when to use them, how to choose the parameters, and introduction to DSCoVer™
- I have a nice dataset. Now what?: Introduction to visualization and quantitative image analysis in Dragonfly Pro.
- Let’s do this together: Book some time with an XRM specialist to discuss your specific sample and/or dataset for optimization of the scan or troubleshooting it.
Please note: This is an advanced level training and all attendees are expected to know the basics of X-ray imaging and working with the Versa XRM.