ZOYC Online

Your ZEISS Microscopy team is pleased to continue the ZEISS on Your Campus (ZOYC) Online series of webinars

Over the course of the next few months, this series will focus on a wide variety of topics facing the research microscopy communities.

View the tracks for the following areas of focus:

Education

Classroom Teaching
Museums

Routine Microscopy

Life Science Research
Clinical Laboratory
Forensics
Metals, Geoscience, and Energy Materials

X-ray Microscopy

FE-SEM

Below are the sessions available for registration now. Select the sessions you would like to attend and check back soon as we add webinars to the schedule.

Education & Routine Track

X-ray Track

FE-SEM Track

Materials characterization using microscopy typically requires a combination of instruments operating across different lengthscales, dimensions, and image modalities. This webinar series highlights recent progress and discovery using two of these types of instruments: field emission scanning electron microscopy (SEM) and X-ray microscopy.

The SEM track focuses on moving beyond pure resolution considerations to the diversity of contrast mechanisms that empower today’s researchers.

Characterization of nanomaterials and their functional properties in their pristine nature, especially beam-sensitive materials, necessitates low-voltage imaging in electron microscopes. Under these conditions, understanding the electric, magnetic, and microstructural crystalline properties at the nanoscale are highly desired beyond conventional analysis such as morphology, topography, and atomic/elemental contrast.

Developments in field emission scanning electron microscopes (FESEMs) have pushed the frontier of low-voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allows researchers and users to see beyond high-resolution micrographs.

The Gemini column introduced by ZEISS 27 years ago was designed to provide optimal low-voltage imaging and analytical performance with ease of use. As we see increasing adoption of this architecture, it is beneficial to understand the advantages of the column and detectors as well as the sweet spots that provide contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast, and scanning transmission electron microscopy, all of which enable applications for the study of engineering materials, electronic materials, and nanomaterials.

This series of webinars and technical notes aims to introduce these contrast mechanisms and their applications to highlight the importance of contrast beyond resolution, which enables researchers to study and understand novel materials and phenomena using the new-age FESEMs.

More Details on FE-SEM Track collapse

The XRM track examines extending materials’ structural characterization into the third dimension, demonstrated through recent scientific discoveries presented by leading researchers in the community.

Materials Research in 3D:
Extending Imaging, Analysis, and Materials Characterization into the Third Dimension

In this track of the virtual seminar series, leading scientists in several fields of materials characterization and analysis share exciting updates on how 3D imaging techniques play a critical role in their research programs. Primary emphasis is on the use of X-ray microCT and X-ray microscopy (XRM) for acquiring nondestructive internal 3D data across multiple lengthscales and image contrast mechanisms. Applications include biomaterials, engineering materials, energy devices, geoscience, and industrial R&D.

More Details on X-ray Track collapse

Education & Routine

Date	Webinar Topic	Speaker
November 9 1:00 pm EST	Microscopes for Routine Tasks in the Life Science Research Laboratory	Vincent Cavaliere	More Information & Access On-Demand
November 11 1:00 pm EST	Microscopes for Education in the Sciences	Vincent Cavaliere	More Information & Access On-Demand
November 12 1:00 pm EST	Smart and Streamlined Digital Microscopy for the Clinical Laboratory	Michael Goegler	Registration
December 1 1:00 pm EST	Smart Microscopy: Fast and Simple routine microscope imaging at your fingertips	Vincent Cavaliere	More Information & Access On-Demand
December 7 1:00 pm EST	Light Microscopes for Metallography, Geoscience, and Energy Materials	Torben Wulff	More Information & Access On-Demand
December 8 1:00 pm EST	Transform your Microscopy with the ZEISS Digital Classroom	Vincent Cavaliere	More Information & Access On-Demand
December 9 1:00 pm EST	ZEISS Microscopes for the Forensic Laboratory	Heinrich Bunger	More Information & Access On-Demand
December 10 1:00 pm EST	A Trip Around the World: ZEISS Microscopes for Museums and Archaeology	Silvia Zenner-Gelrich	More Information & Access On-Demand

X-ray Microscopy

Date	Webinar Topic	Speaker
October 21 12:00 pm EDT	Microscopy of Biological Materials for Bioinspired Design	Professor Rich Johnston	More information & Access On-Demand
November 4 1:00 pm EST	Tales of the Abnormal: Grain Growth in the Presence of Particles	Professor Ashwin Shahani	More information & Access On-Demand
November 18 2:00 pm EST	In Situ Lab- and Synchrotron-based X-ray Microscopy Applied to Next-generation Battery Development	Dr. Johanna Nelson & Geoff McConohy	More information & Access On-Demand
December 2 2:00 pm EST	The Changing of the Ecological Guard at the Ediacaran-Cambrian Transition	Professor Jim Schiffbauer and Dr. Tara Selly	More information & Access On-Demand
January 20 1:00 pm EST	Accelerating the Impact and Growth of Your Core Microscopy Lab with 3D X-ray Imaging	Professor Sina Shahbazmohamadi	More information & Registration
January 26 2:00 pm EST	Materials Testing and Development at Corning Inc. using XCT Technology	Melroy Borges, PhD	More information & Registration

FE-SEM

Date	Webinar Topic	Speaker
October 20 11:00 am EDT	Imaging magnetic materials and nanoparticles	Luyang Han	More information & Access On-Demand
October 27 11:00 am EDT	STEM Imaging and Tomography in a SEM	Vignesh Viswanathan	More information & Access On-Demand
November 3 11:00 am EST	Low-kV Scanning Electron Microscopy - Beyond Sample Topography	Dr. Jozwik	More information & Access On-Demand

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