ZOYC Online

Characterization of nanomaterials and their functional properties in their pristine nature, especially beam-sensitive materials, necessitates low-voltage imaging in electron microscopes. Under these conditions, understanding the electric, magnetic, and microstructural crystalline properties at the nanoscale are highly desired beyond conventional analysis such as morphology, topography, and atomic/elemental contrast.

Developments in field emission scanning electron microscopes (FESEMs) have pushed the frontier of low-voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allows researchers and users to see beyond high-resolution micrographs.

The Gemini column introduced by ZEISS 27 years ago was designed to provide optimal low-voltage imaging and analytical performance with ease of use. As we see increasing adoption of this architecture, it is beneficial to understand the advantages of the column and detectors as well as the sweet spots that provide contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast, and scanning transmission electron microscopy, all of which enable applications for the study of engineering materials, electronic materials, and nanomaterials.

This series of webinars and technical notes aims to introduce these contrast mechanisms and their applications to highlight the importance of contrast beyond resolution, which enables researchers to study and understand novel materials and phenomena using the new-age FESEMs.