ZOYC Online

Your ZEISS Microscopy team is pleased to continue the ZEISS on Your Campus (ZOYC) Online series of webinars

Materials characterization using microscopy typically requires a combination of instruments operating across different lengthscales, dimensions, and image modalities. This webinar series highlights recent progress and discovery using two of these types of instruments: field emission scanning electron microscopy (SEM) and X-ray microscopy.

  • The SEM track focuses on moving beyond pure resolution considerations to the diversity of contrast mechanisms that empower today’s researchers.

Characterization of nanomaterials and their functional properties in their pristine nature, especially beam-sensitive materials, necessitates low-voltage imaging in electron microscopes. Under these conditions, understanding the electric, magnetic, and microstructural crystalline properties at the nanoscale are highly desired beyond conventional analysis such as morphology, topography, and atomic/elemental contrast.

Developments in field emission scanning electron microscopes (FESEMs) have pushed the frontier of low-voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allows researchers and users to see beyond high-resolution micrographs.

The Gemini column introduced by ZEISS 27 years ago was designed to provide optimal low-voltage imaging and analytical performance with ease of use. As we see increasing adoption of this architecture, it is beneficial to understand the advantages of the column and detectors as well as the sweet spots that provide contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast, and scanning transmission electron microscopy, all of which enable applications for the study of engineering materials, electronic materials, and nanomaterials.

This series of webinars and technical notes aims to introduce these contrast mechanisms and their applications to highlight the importance of contrast beyond resolution, which enables researchers to study and understand novel materials and phenomena using the new-age FESEMs.

  • The XRM track examines extending materials’ structural characterization into the third dimension, demonstrated through recent scientific discoveries presented by leading researchers in the community.

Materials Research in 3D:
Extending Imaging, Analysis, and Materials Characterization into the Third Dimension

In this track of the virtual seminar series, leading scientists in several fields of materials characterization and analysis share exciting updates on how 3D imaging techniques play a critical role in their research programs. Primary emphasis is on the use of X-ray microCT and X-ray microscopy (XRM) for acquiring nondestructive internal 3D data across multiple lengthscales and image contrast mechanisms. Applications include biomaterials, engineering materials, energy devices, geoscience, and industrial R&D.

FE-SEM

Date

Webinar Topic

Speaker

 

October 20
11:00 am EDT

Imaging magnetic materials and nanoparticles​

Luyang Han

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October 27
11:00 am EDT

STEM Imaging and Tomography in a SEM

Vignesh Viswanathan

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November 3
11:00 am EST

Low-kV Scanning Electron Microscopy - Beyond Sample Topography

Dr. Jozwik

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X-ray Microscopy

Date

Webinar Topic

Speaker

 

October 21
12:00 pm EDT

Microscopy of Biological Materials for Bioinspired Design

Professor Rich Johnston

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November 4
1:00 pm EST

Tales of the Abnormal: Grain Growth in the Presence of Particles

Professor Ashwin Shahani

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November 18
2:00 pm EST

In Situ Lab- and Synchrotron-based X-ray Microscopy Applied to Next-generation Battery Development

Dr. Johanna Nelson & Geoff McConohy

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December 2
2:00 pm EST

The Changing of the Ecological Guard at the Ediacaran-Cambrian Transition

Professor Jim Schiffbauer and Dr. Tara Selly

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January 20
1:00 pm EST

Accelerating the Impact and Growth of Your Core Microscopy Lab with 3D X-ray Imaging

Professor Sina Shahbazmohamadi

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January 26
2:00 pm EST

Materials Testing and Development at Corning Inc. using XCT Technology

Melroy Borges, PhD

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