Workpieces are getting smaller; manufacturing tools are able to produce impressively small features with very ambitious tolerances. ZEISS Zaphire brings metrology functionalities to microscopy – giving you higher quality and better productivity.
Choose between different operating modes for the GUI depending on your user level: full control of all operating parameters allows you to set certain levels of software control for different users. Or concise GUI developed for the occasional user with the major operating controls in one conveniently arranged control bar for ease of operation and increased productivity. Extend the functionality easily at anytime with extra modules for comprehensive image acquisition, processing, analysis and documentation.