FEG-SEM as a Flexible and Smart Tool for R&D Nanolithography
![Pasqualantonio Pingue, Ph.D. Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, Italy]({"small":"https://images.zeiss.com/Microscopy/resource-center/authors/pasqualantonio_pingue.ts-1596802036466.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=41acc1a6abd4f4111c69ae938c058379","large":"https://images.zeiss.com/Microscopy/resource-center/authors/pasqualantonio_pingue.ts-1596802036466.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=c0320b7ad3a760d31875bfff3223b56a","medium":"https://images.zeiss.com/Microscopy/resource-center/authors/pasqualantonio_pingue.ts-1596802036466.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=07d02a1e7d22e77df67e6fb860b01c58","full":"https://images.zeiss.com/Microscopy/resource-center/authors/pasqualantonio_pingue.ts-1596802036466.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=4ffad72022382a95c3e4f89f87682953"} "Pasqualantonio Pingue, Ph.D. Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, Italy")
Pasqualantonio Pingue, Ph.D.
Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, Italy
Creation of nanostructures and nanodevices using a focused ion beam is widely used in materials research and electronics. It allows the creation of new functional materials or surfaces with superior optical, mechanical, electronic or magnetic properties. In this session we will explore these applications to highlight the future development and the constraints encountered in this field.
![]({"small":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview-feg-sem-user-meeting-italy.ts-1596802763872.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=130eb83d630574a81f37526bf93f7106","large":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview-feg-sem-user-meeting-italy.ts-1596802763872.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=5ad5123a4e2c097ea879bf9c3a62c55d","medium":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview-feg-sem-user-meeting-italy.ts-1596802763872.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=68862e460766a11073eaf7e79c81ce22","full":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview-feg-sem-user-meeting-italy.ts-1596802763872.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=7e0924993575272425cc6d7c4aa3c28b"})
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