Low-kV Scanning Electron Microscopy
Beyond Sample Topography
![Iwona Jóźwik, Ph.D., Łukasiewicz Institute of Electronic Materials Technology]({"small":"https://images.zeiss.com/Microscopy/resource-center/authors/iwona-jozwik.ts-1596635865894.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=3dcf114c251c515fb10b62a7077178ce","large":"https://images.zeiss.com/Microscopy/resource-center/authors/iwona-jozwik.ts-1596635865894.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=aa613d5952adc9e3ef06039640acd9e3","medium":"https://images.zeiss.com/Microscopy/resource-center/authors/iwona-jozwik.ts-1596635865894.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=8e7e540a35b9d9d1726b5fc9f6999448","full":"https://images.zeiss.com/Microscopy/resource-center/authors/iwona-jozwik.ts-1596635865894.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=d6c49c8ff3bfe796a89a37ad1573c10f"} "Iwona Jóźwik, Ph.D., Łukasiewicz Institute of Electronic Materials Technology")
Iwona Jóźwik, Ph.D.
Łukasiewicz Institute of Electronic Materials Technology
FIB-SEM allow to obtain morphological, compositional and analytical information from the surface, and cut cross-sections to image beneath the sample surface at the highest resolution. Moreover, this is the perfect tools to prepare specimens for other microscopic techniques such as TEM or STEM.
![]({"small":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview_low-kv-sem.ts-1596719754900.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=c9c8bd689776926e21938e43169ff091","large":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview_low-kv-sem.ts-1596719754900.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=3ad29a57e0097c9b140689277ec2d6d5","medium":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview_low-kv-sem.ts-1596719754900.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=3ed0b3864e5c4c4267fa773b76888fe7","full":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/preview_low-kv-sem.ts-1596719754900.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=a836f2f2ebf61c667dc93aa3b836bf62"})
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