Low-kV Scanning Electron Microscopy

Beyond Sample Topography

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Iwona Jóźwik, Ph.D., Łukasiewicz Institute of Electronic Materials Technology
Iwona Jóźwik, Ph.D. Łukasiewicz Institute of Electronic Materials Technology

FIB-SEM allow to obtain morphological, compositional and analytical information from the surface, and cut cross-sections to image beneath the sample surface at the highest resolution. Moreover, this is the perfect tools to prepare specimens for other microscopic techniques such as TEM or STEM.


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