In this webinar, the details of the femtosecond laser, integration of the system and the workflow using the Crossbeam laser together with a X-ray Microscope will be presented along with application examples focusing on geoscience, electronics, battery research and additive manufacturing.
- Innovative 3 beam concept for fast and easy sample preparation of various material classes
- Dual chamber approach: Massive material removal without contamination
- Integrated correlative workflow with X-ray Microscopy
Discover the new LaserFIB for ZEISS Crossbeam, your femtosecond laser for ultrafast material processing of large samples. Fabricate samples on the scale from 10 µm to 1 mm or more. Cut deep cross-section through hard material such as SiC and expose structures of interest directly. When performing laser milling you will easily avoid contamination of your FIB-SEM as the laser is attached to a dedicated chamber which is separated from the main instrument chamber.