Bridge the Micro and Nano World in Materials Inspection and Analysis
Available on all ZEISS light- and electron microscopes with motorized stages
Shuttle & Find from ZEISS is a correlative microscopy interface for light- and electron microscopes, designed specifically for use in materials analysis.
A combined hardware and software solution, it allows you to transfer your specimen from one microscope system to another in just minutes – a process that has until now taken hours, or even days.
Shuttle & Find is an extremely flexible two-way system that allows you to combine any number of ZEISS systems for correlative microscopy. It also supports intermediate preparation steps, ensuring your sample is optimally prepared for use when you switch from one system to the other.
Importantly for materials analysis, Shuttle & Find speeds up your workflow by automating the process of searching the same region of interest. This reduces cycle times, allowing you to process a considerable larger number of samples in a shorter period.
Analysis on concrete sample.
Courtesy of Brno University of Technology
Correlative Particle Analyzer: Fast particle analysis
Bridge the Micro and Nano World in Materials Inspection and Analysis
pages: 12
file size: 9024 kB
Shuttle & Find
pages: 6
file size: 1951 kB
Correlative Microscopy allows a high productivity in structural analysis of Li-ion batteries due to a fast, reliable and precise workflow between light microscopy and SEM.This enables new possibilities especially for quantitative image data analysis of the same region of interest.
pages: 6
file size: 1177 kB
"We present the cross–section sample analysis of an oil painting on canvas. Correlative Light and Electron Microscopy (CLEM) is used for analyzing the cross–section samples
pages: 6
file size: 1600 kB
Interface for Correlative Microscopy in Materials Analysis
pages: 5
file size: 2766 kB
By Combining Light and Scanning Electron Microscopy in a Correlative Workflow
pages: 8
file size: 1456 kB
pages: 5
file size: 1244 kB
of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy
pages: 6
file size: 1755 kB
Capture the essentials of your component. Quickly. Simply. Comprehensively.
pages: 41
file size: 4477 kB
Ask your ZEISS contact about Shuttle & Find now!