Focused Ion Beam Scanning Electron Microscopes

(FIB-SEM)

Speed up nanotomography and nanofabrication applications.
ZEISS FIB-SEMs let you benefit for processing and sample preparation on a nanoscopic scale for materials in life sciences as well as in industry.

  • Combine 3D imaging, analysis and material processing
  • Profit from a next-generation FIB when preparing your sample
  • Enjoy real-time interaction and perform imaging and milling simultaneously