ZEISS 3DSM

Analyze Topographical Samples in 3D

Ceramics surface imaged using 3DSM
Ceramics surface imaged using 3DSM
Thread of a screw imaged using 3DSM
Thread of a screw imaged using 3DSM
Forensic study of imprint on bullet shell using 3DSM
Forensic study of imprint on bullet shell using 3DSM

3D Surface Modelling

Use Your SEM to Reconstruct the Surfaces of Your Samples

Your scanning electron microscope measures and analyzes all kinds of samples in 2D: to analyze the surfaces of samples in 3D, use 3DSM, the optional sotware package from ZEISS. Get topographical information by reconstructing a complete 3D model of your sample’s surface using the signals of the aBSD or the AsB detector.

Highlights

3DSM

  • Perform a 3D surface reconstruction of samples examined with electron microscopes equipped with an AsB (Angular selective Backscatter) or aBSD (annular Backscatter) detector
  • Combine 3DSM with SmartSEM , the software that operates the SEM, for real-time 3D imaging or operate in stand-alone mode to visualize archived project files
  • Profit from real-time operation and reconstruction times < 2s

3DSM Metrology

  • Upgrade your ZEISS FE-SEM with the optional package 3DSM Metrology to gain automatic measurements and documentation in compliance with ISO 25178, DIN and ASME and other standards for routine checks
  • Analyze surfaces in 3D and generate complete measurement records
  • Characterize surfaces and profiles including parameters such as step height, distance, nanometer scaled contour, roughness and waviness, particle and grain size
  • Create completely traceable metrological reports

Downloads

3DSM

3D Surface Modelling

pages: 6
file size: 426 kB

Technical Note

The Real Time 3DSM Solution for the ZEISS GeminiSEM Family

pages: 6
file size: 2130 kB

Results 1 - 2 of 2