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ZEISS Liberation & Surface Exposure Analyzer

From the Solutions Lab for 3D Surface Exposure Analysis for Mining

Highlights
Workflow
Components
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One of the biggest challenges during mining processing and comminution is that of generating accurate and reliable information about the incremental increase in exposed surface area and mineral liberation associated with that comminution process. The technologies typically used to address and analyze these processes use automated 2D mineral classification and analysis based on scanning electron microscopy (SEM) based energy dispersive (X-ray) spectroscopy (EDS). These techniques, however, only offer 2D information, and so cannot accurately quantify mineral distributions and associations, especially exposed surface area (an inherently 3D feature).

ZEISS Liberation & Surface Exposure Analyzer module, an extension of the ZEISS ZEN image processing platform, allows for the automated creation of particle-by-particle analyses of 3D liberation and surface area based on X-ray microscopy (XRM) and advanced image segmentation, processing and analysis. While there are significant individual technical and technological accomplishments throughout the module, the real power comes from the integration of multiple state-of-the-art techniques into a single, easy to use industrial workflow.

One of the biggest challenges during mining processing and comminution is that of generating accurate and reliable information about the incremental increase in exposed surface area and mineral liberation associated with that comminution process. The technologies typically used to address and analyze these processes use automated 2D mineral classification and analysis based on scanning electron microscopy (SEM) based energy dispersive (X-ray) spectroscopy (EDS). These techniques, however, only offer 2D information, and so cannot accurately quantify mineral distributions and associations, especially exposed surface area (an inherently 3D feature).

ZEISS Liberation & Surface Exposure Analyzer module, an extension of the ZEISS ZEN image processing platform, allows for the automated creation of particle-by-particle analyses of 3D liberation and surface area based on X-ray microscopy (XRM) and advanced image segmentation, processing and analysis. While there are significant individual technical and technological accomplishments throughout the module, the real power comes from the integration of multiple state-of-the-art techniques into a single, easy to use industrial workflow.

Highlights

Area of Research:

  • Mining and Advanced Materials
  • Additive Manufacturing

Samples:

Mining rock samples

Related Solutions:

  • Additive Manufacturing Powder analyzer
Automatic generation of grade/recovery curves through quantitative 3D analysis
Automatic generation of grade/recovery curves through quantitative 3D analysis
Segmented particle distribution, showing sulfides (red), silicates (blue) and air (yellow)
Segmented particle distribution, showing sulfides (red), silicates (blue) and air (yellow)
Individual particles identified such that each particle is identified in a different color. This is then used to measure surface exposure via exposed surface area.
Individual particles identified such that each particle is identified in a different color. This is then used to measure surface exposure via exposed surface area.

Workflow

The module workflow consists of a number of steps:

The module workflow consists of a number of steps:

  1. XRM acquisition.
  2. Consistent reconstruction using controlled projection greyscale scaling.
  3. Consistent segmentation using machine learning based segmentation. Accurate associated surface segmentation using conditional random field (CRF) smoothing. Accurate segmentation both ensures the accuracy of particle separation and surface classification.
  4. Particle identification and separation using advanced non-local morphometric techniques. There are no user-determined parameters in this step, allowing for robust and repeatable measurements.
  5. Liberation measurement.
  6. Grain surface meshing, classification and measurement.
  7. Label (particle separated) image exporting.
  8. Grain & particle image export.
  9. Particle by particle data reporting & export.
  10. Grade-recovery curve generation

Required components

  • ZEISS Xradia Context or Versa XRM 5XX +
  • ZEN Pro
  • ZEN Macro Environment
  • ZEISS Intellesis
  • ZEISS Surface Exposure custom workflow2

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Problems ​we can help you solve: ​

  • automation of your imaging process or workflow
  • advanced image analysis and corrections
  • automation of your ROI (region of interest) search
  • tailoring flexible and adaptable workflows for your configuration
  • even, small applications that turn 20 clicks into one.

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