ZEISS Additive Manufacturing Powder Analyzer

From the Solutions Lab for Metals Part Production

One of the biggest challenges of X-ray microscopy, particularly when imaging at high resolution, is that of phase contrast. Differences in wave speed between materials leads to the development of phase fringes. These fringes can be informative, particularly when they help to emphasize small features with limited absorption contrast, however they can obscure subtle variations in contrast that may be required for segmentation or quantification.

ZEISS Phase Contrast Enhancer for XRM removes these phase artifacts by explicit modeling of the phase artifact, then deconvolving it in 3D across the entire volume. It provides an intuitive workflow-based interface for the determination of the phase fringe size and shape, allowing for rapid and optimal phase removal. Once phase effects are removed, only traditional absorption contrast remains, making the dataset very amenable to denoising algorithms. To facilitate a simple additional denoising step, a non-local means denoising tool is included, and can be activated as an additional automated step in the workflow.

ZEISS Phase Contrast Enhancer can be seamlessly inserted into an XRM analysis workflow, maintaining all XRM metadata in its native format.

One of the biggest challenges of X-ray microscopy, particularly when imaging at high resolution, is that of phase contrast. Differences in wave speed between materials leads to the development of phase fringes. These fringes can be informative, particularly when they help to emphasize small features with limited absorption contrast, however they can obscure subtle variations in contrast that may be required for segmentation or quantification.

ZEISS Phase Contrast Enhancer for XRM removes these phase artifacts by explicit modeling of the phase artifact, then deconvolving it in 3D across the entire volume. It provides an intuitive workflow-based interface

for the determination of the phase fringe size and shape, allowing for rapid and optimal phase removal.

Once phase effects are removed, only traditional absorption contrast remains, making the dataset very amenable to denoising algorithms. To facilitate a simple additional denoising step, a non-local means denoising tool is included, and can be activated as an additional automated step in the workflow.

ZEISS Phase Contrast Enhancer can be seamlessly inserted into an XRM analysis workflow, maintaining all XRM metadata in its native format.

Highlights

Area of Research:

  • Materials Science
  • Raw Materials

Sample Types:

  • All materials research

Related Applications:

  • 3D particle analysis (mining)
  • 3D particle analysis (additive)
Uncorrected image of plastic sample
Uncorrected image of plastic sample.
PPCF_phasefringeremoved
PPCF_phasefringeremoved
Denoised image.
Denoised image.

Required components

  • Versa XRM 5XX +
  • Phase Contrast Enhancer app

Need More Information?

Please contact us using the following form.

Problems ​we can help you solve:

  • automation of your imaging process or workflow
  • advanced image analysis and corrections
  • automation of your ROI (region of interest) search
  • tailoring flexible and adaptable workflows for your configuration
  • even, small applications that turn 20 clicks into one.

Big problems, little problems. What is your problem? Use the form on this page to tell us more.​

You may want to bookmark this site and check back frequently as we are rapidly creating new solutions.

Unable to load form.