ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement
From the SolutionsLab for Coatings, Thin Films and Roughness
Highlights
Area of Research:
- Industrial R&D
- Materials Science
Sample Types:
- Semiconductor
- Metals
- Glass
- Ceramics
- Graphene
Related Solutions:
- Calotte Grinding Workflow
- Layer Thickness Measurement

Graphene on SiO2 (300nm) Silicon substrate
Workflow
How to profile TIC images:
- In ZEN record or load a TIC image in lsm, zvi, or czi format.
- Start the TIC macro
- Segment the interferogram line for evaluation
- Click “finish” and the Apeer module calculates the raw profile image for control, if you don’t have unwanted pieces of the profile or anything missing. Usually you don’t change the default parameters and proceed
- After this last step you will receive the resulting profile as profile_coords.csv table and as profile_graph.png screenshot of the profile, both in the active documents in ZEN and in the former indicated TIC images folder
Required components
Microscope
- Axio Imager
- Axioscope
- LSM 900 Mat
Optical components
- C-DIC reflector module for reflected light
- 6x20 TIC slider
- Axiocam Digital Camera
Software
- ZEN blue 3.2 or higher
- TIC software (Image Analysis Setting 1_TIC.czias, OAD macro, Key to download Apeer modules: line detection and profile calculation)
- Apeer module on-site
- Docker desktop
- Windows 10 OS
- 8 GB RAM, 2 CPUs
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