ZEISS upgrades to improve performance and life time

Learn More about Upgrades

And their Benefits for Your Processes

C-SEM Upgrades for an Increased Life Time and Extended Functionality

Benefit from multi-modal images and comprehensive multiscale with the various options of ZEISS Atlas 5.Increase your convenience and facilitate your work routine e.g. reduced loading time and increased sample throughput through the Airlock or a significantly reduced noise level through the Vac Quiet Mode. Explore our latest PC-Hardware, Software versions and license extensions.Upgrade your microscope with additional accessories such as sample holders and motorized objective apertures. Analyze your sample through a wide range of different detectors, e.g. for backscattered electrons and secondary electrons.

Other Upgrades

Detectors & Analytics

Analyze your sample through a wide range of different detectors, e.g. with secondary and backscattered electrons. Different detectors allow you to receive various types of information about the surface, composition and other details which will help you to improve and ease your processes.

EVO Beam Deceleration
Capture images with improved contrast and topographical details

ZEISS Beam Deceleration is an improved EVO conventional scanning electron microscope (C-SEM) sample bias module which enables beam deceleration imaging with enhanced surface contrast and topographical detail in combination with the ZEISS HD BSE (backscattered electrons) detector.

Benefits

  • Low interaction volume
  • Improved surface information
  • Charge neutralization

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C2D

The Cascade Current Detector (C2D) replaces the VPSE G3 and VPSE G4 to enable very low kV imaging in variable pressure (VP) mode. Images at 1 - 3 kV are now far more effectively captured.

Benefits

  • Variable visualization
  • Enhanced water vapor resolution
  • Higher pressure range

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C2DX

The Extended Range Cascade Current Detector (C2DX) is a detector unique to the EVO Series and is designed to provide superb imaging performance at the highest pressure up to 3000 Pa.

Benefits

  • Minimized sample preparation
  • Improved signal to noise imaging
  • Increased pressure range

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Nanostructuring & Patterning

Create structures in nanometer range by either removing or applying surface material and using different systems (e.g. Atomic Force Microscope), or benefit from multi-modal images and comprehensive multiscale with the various options of ZEISS Atlas 5.

Atlas 5
Master Your Multi-scale Challenge

ZEISS Atlas 5 makes your life easier: create comprehensive multiscale, multi-modal images with a sample-centric correlative environment.

Benefits
  • Correlate images in multiple dimensions from multiple sources
  • Fast and easy image acquisition
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Software & Workstation

Explore our latest software versions and extended functionality through license options as well as the current recommended high performance PC-Hardware to optimize your systems performance.

SEM Workstation
Efficient Workflows, Intuitive Navigation and Faster File Search

The ZEISS Workstation upgrade improves the daily process by using the latest SmartSEM software, high performance hardware specification and latest operating system.

Benefits
  • Latest SmartSEM version
  • Intuitive navigation
  • Windows 10
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SmartPI
Simplify Your Operation and Analyze Each Particle Automatically

Smart Particle Investigator (SmartPI), your advanced particle analysis and classification solution turns scanning electron microscopes (SEM) into turnkey solutions for industrial cleanliness or metal and steel applications.

Benefits

  • Simple & quick analysis
  • Intelligent particle detection
  • Live progress tracking

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Software Module Catalog
Extend the Functionality and Performance of Your Microscope

Add new and improve existing functionality through our broad range of licenses which will help you to improve your processes, ease the use of your system and have tools to receive more information.

Benefits
  • Improve your processes by new functionality
  • More comfortable usage
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Shuttle & Find

With Shuttle & Find you connect your electron microscope and light microscope from ZEISS. The combined hardware and software solution enables you to transfer your specimen from one microscope system to another within just minutes.

Benefits

  • Receive more information
  • Fast calibration
  • Flexible choice of components

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Smart SEM touch

Select an area of interest with a simple swipe of your finger and the EVO-System will automatically collect your data, running unattended whilst you perform other tasks. The upgrade enables you a comfortable workflow through its contemporary touch interface and a variety of automated tools.

Benefits

  • Sample type select
  • Detector overlays
  • Annotate & measure

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Vacuum & Ease of Use

Increase your convenience and facilitate your work routine e.g. reduced loading time and increased sample throughput through the Airlock or a significantly reduced noise level through the Vac Quiet Mode. Decontaminate your specimen and chamber with the Plasma Cleaner or improve image quality through the compensation of charging effect with the Flood Gun or the Charge Compensation.

Plasma Cleaner
Clean Your Chamber Quickly and Effectively

ZEISS offers you a fast and cost-efficient solution for specimen and chamber decontamination. A Plasma Cleaner is used to generate reactive gas-phase radicals in a plasma. The radicals migrate into the instrument chamber and chemically react with the unwanted hydrocarbons.

Benefits
  • Improved image quality
  • Fast specimen decontamination
  • Safe decontamination
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Vac Quiet Mode
Reduce Noise and Save Energy

By using Vac Quiet Mode and with help from a vacuum reservoir the pre-pump is automatically switched off after reaching a factory pre-set vacuum level. The vacuum reservoir allows the system to be operated for hours without the need of the pre-pump. This results in both the reduction of noise levels and energy consumption.

Benefits
  • More comfortable application
  • High definition imaging
  • Energy-saving
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Other Accessories

Upgrade your microscope with additional accessories such as sample holders, the latest version of our dual joystick controller and control panel or an Uninterruptible Power Supply (UPS) which ensures the safety of your system in case of a power failure.

Uninterruptible Power Supply
Secure Your Microscope in Case of a Power Failure and Prevent Data Loss

An Uninterruptable Power Supply (UPS) will be used if there is no steady supply of electrical power possible. It is designed to bridge short power failures and to shut down the microscope in a controlled manner during longer power failures.

Benefits
  • Bridge brief power failures
  • Safety for your microscope
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Dual Joystick and Control Panel

With the Dual Joystick Controller and the Control Panel installed, operating becomes much more comfortable. The Dual Joystick Controller can be used for stage control and specimen navigation and the Control Panel gives you easy access to the most frequently used functions of the SEM.

Benefits
  • Many compensation possibilities
  • Various configuration options
  • Convenient handling
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