Upgrade your microscope with additional accessories to enhance your microscope's capability
Advanced Reconstruction Toolbox (ART) introduces Artificial Intelligence (AI)-driven reconstruction technologies on your ZEISS Xradia 3D X-ray microscope (XRM) or microCT. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.
Discover how speed of data acquisition and reconstruction as well as image quality are enhanced without sacrificing resolution by using OptiRecon, two variants of DeepRecon and PhaseEvolve, the unique modules of ART.
- Improve data collection and analysis for accurate and faster decision-making
- Greatly enhance image quality
- Achieve superior interior tomography or throughput on a broad class of samples
- Reveal subtle difference through improved contrast-to-noise
- Increase speed at an order of magnitude for sample classes requiring repetitive workflow
The optional modules are workstation-based solutions for easy access and usability:
- DeepRecon Pro & Custom for Deep learning-based reconstruction
- PhaseEvolve for contrast enhancement
- OptiRecon for iterative reconstruction
ZEISS DeepRecon Pro provides a straightforward, uncomplicated, and powerful application of AI and deep neural network technology for enhancing X-ray tomography results without prior knowledge on deep learning technology. [...] It helps us to reduce the scan time required for in situ fluid-rock interaction experiments when we need to work with long exposure times.Dr. Markus Ohl | X-Ray microscopy | EPOS-NL MINT | Utrecht University, NL
ZEISS sample holders are designed with kinematic principles in mind for accurate and repeatable placement on the sample stage. Each design offers unique gripping techniques to accommodate your sample properly for imaging. In addition, the designs are proven for X-ray imaging stability. Specify whether your mount is for standard use or to be compatible with the Autoloader.
Ensure that your data is properly calibrated to Hounsfield units, in which air and water have values of 0 and 100, by using the ZEISS CT Scaling Phantom. Extend your range of low-energy and high-energy filters by exploring the additional filter options offered by ZEISS for higher energy filtering requirements and applications such as metallurgy.
Enhance the user experience and the depths of your analysis workflow using advanced hardware and computational software available through ZEISS.
In order to maintain instrument uptime for imaging, many prefer streamlining their workflow via a secondary analysis workstation. The secondary workstation supports additional studies optimizing reconstruction, navigating and visualizing datasets, and post-processing results.
- Interactive tool to learn more about Scout and Scan
- Easy software upgrade guide
- Workstation compatibility information
- Learn more about available additional software funtionallity
- Additional information about other XRM modules
Note: Press ESC to exit full-screen mode
Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation and object analysis to quantify your results.
SmartShield is a simple solution that protects your sample and your microscope, working within Scout-and-ScanTM control system. SmartShield wraps a digital “envelope” around your sample with an easy click of a button. This automated solution allows you to confidently bring your sample even closer to the source and detector. With SmartShield, new and advanced users alike can experience an elegant sample setup workflow and efficient navigation of the Versa system.
Discover add-on integrated tensile testing solutions for in situ X-ray applications.
A modular tensile & compression testing system can be installed within the Versa system to achieve clear visual interpretation of how the properties of materials and composites change under different loading conditions.
Experience the highest level of stability, flexibility and controlled integration of several types of in-situ devices on the Xradia Versa, which benefit from an optical architecture that takes into account resolution in variable environmental conditions. Perform in situ and 4D (time dependent studies) to understand the impact of heating, cooling, wetting, tension, tensile compression, drainage and other simulated environmental studies.
Achieve direct visualization of 3D crystallographic grain orientation and morphology in a non-destructive tomography environment with the LabDCT advanced imaging module powered with GrainMapper3D software by Xnovo Technology. Achieve enhanced understanding of the fundamental materials science behind these processes with microscopic imaging features in three dimensions.
Miniaturization and integration of components drive growing demand for high-resolution metrology. ZEISS introduced an entirely new realm of non-destructive insights into submicron details with Xradia Versa X-ray microscopes. Benefit from high-resolution X-ray imaging combined with high-precision metrology. Get verified measurement accuracy of smalldimensions in reconstructed volumes of lessthan 125 mm3.
By adding the Autoloader to your configuration, you can set-up queues of imaging jobs across a shift or over a weekend. Receive automatic notification of job completion. Minimize user interaction in your research or industrial laboratory, industrial process development, service laboratory, or university central imaging laboratory.
Image large samples and create workflow effeciencies with FPX for industrial and academic research. Rapidly scout large areas to identify a desired region of interest (ROI). Combine FPX with RaaD on Xradia 500-series and 600-series and benefit further from high resolution imaging for a variety of samples.
Increase your instrument performance and capabilities by upgrading to the next model
The ZEISS Xradia 620 Versa 3D X-ray microscope unlocks new degrees of flexibility for your scientific discovery. Building on industry’s best resolution and contrast, Xradia 620 Versa expands the boundaries of non-destructive imaging for break¬through flexibility and discernment critical to your research.
- Attain down to sub-micron resolution
- Advanced phase contrast techniques for image enhancements
- Non-destructive characterization in-situ and in 4D
- Higher X-ray flux and faster scans without compromising resolution