ZEISS Xradia 520 Versa New Update: LabDCT
Unlocking crystallographic information in your lab

ZEISS Xradia 520 Versa

Your X-ray Microscope for Submicron X-ray Imaging

With ZEISS Xradia 520 Versa you extend the limits of your exploration.

Unlock versatility for your scientific discovery and industrial research with ZEISS Xradia 520 Versa, the most advanced model in the Xradia Versa family. Image non-destructively in 3D with X-rays. Build on industry-best resolution and contrast. Expand the boundaries of non-destructive imaging. Innovative contrast and acquisition techniques free you to seek - and find – what you’ve never seen before.

Benefits in Xradia 520 Versa

A defective TSV (through-silicon-via, a high performance interconnection in a silicon wafer)

A defective TSV (through-silicon-via, a high performance interconnection in a silicon wafer)

A defective TSV (through-silicon-via, a high performance interconnection in a silicon wafer)
Defective TSV. High resolution, non-destructive imaging of intact package
Using Scout-and-Zoom to identify region of interest, zoom to clear view of suspected defect. Courtesy of ST Crolles

Experience Resolution Beyond Micro-CT

Explore a multitude of lab-based applications, sample types and sizes with ZEISS Xradia 520 Versa. Benefit from extending your research beyond the limits of basic projection-based micro-and nano-CT systems. Achieve images with a spatial resolution of 0.7 µm and minimum achievable voxel of 70 nm.

  • Discover the high-resolution optics of Xradia 520 Versa. Where traditional tomography relies on a single stage of geometric magnification, Xradia 520 Versa features a unique two-stage process.
  • Benefit from the two-stage process that provides you with Resolution at a Distance (RaaD). With RaaD you maintain submicron resolution at large, flexible working distances. 
  • Equip your Xradia 520 Versa with FPX (Flat Panel Extension) that enables non-destructive interior tomography. Investigate samples 10x greater in volume with 2-5x greater throughput.
Resolution at a Distance
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A virtual cross section through a mouse knee data set

A virtual cross section through a mouse knee data set

A virtual cross section through a mouse knee data set
A virtual cross section through a mouse knee data set
Showing strong absorption contrast even between multiple low density materials

Enhance Your Images with Advanced Contrast Techniques

Get images of challenging samples using advanced contrast capabilities like proprietary enhanced absorption contrast or tunable propagation phase contrast.

  • Use enhanced absorption contrast detectors to maximize the collection of contrast-forming low energy X-ray photons that are critical to imaging material types
  • Visualize materials of low atomic numbers or biological samples that tend to have limited absorption contrast with tunable propagation phase contrast 
  • Maximize discernibility with dual energy probing of features normally indistinguishable within a single scan
Contrast for low atomic number materials
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In situ compression of a metal foam

In situ compression of a metal foam

In situ compression of a metal foam
In situ compression of a metal foam

Characterize Materials in situ and in 4D

Characterize the 3D microstructure of materials nondestructively. Uniquely work in simulated conditions – in situ – or study the evolution of your samples’ properties over time in 4D.

  • Do submicron imaging of samples up to inches in size within environmental chambers and under varying conditions using a variety of in situ rigs
  • Benefit from maintaining high resolution with RaaD as the space between the X-ray source and the sample grows whereas the resolution of conventional micro-CT architecture degrades when samples are placed within spacious in situ chambers
  • Acquire images at high throughput in a large field of view with FPX, and then nondestructively sub-sample your region of interest with RaaD, all in one system
Maintain resolution in situ
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The Technology Behind X-ray Optics

Discover the magnification concept

Discover the magnification concept

Discover the magnification concept
Discover the magnification concept
The microscope uses a combination of geometric and optical magnification to produce a high resolution image of the sample. With this, the system produces Resolution at a Distance (RaaD)

Profit from achieving submicron resolution at large working distances, known as Resolution at a Distance (RaaD). Xradia Versa architecture natively uses a two-stage magnification: images are initially enlarged through geometric magnification as they are in conventional micro-CTs. The projected image impinges on a scintillator, which converts X-rays to visible light. Your image is subsequently magnified by an optical objective before reaching the detector. Add the optional flat panel extension (FPX) to your system to further increase its versatility. This combination of detector designs allows you to study a wide range of sample sizes and types efficiently and accurately.

Highlights

Optimize contrast for maximum discernibility

Optimize contrast for maximum discernibility

Optimize contrast for maximum discernibility
Optimize contrast for maximum discernibility
Segmentation of Al particles using the 2D histogram. DSCoVer results of combined low energy (LE) and high energy (HE) XRM datasets.

Dual Scan Contrast Visualizer (DSCoVer)

With DSCoVer you take advantage of how X-rays interact with matter based on effective atomic number and density. Probe for features normally indistinguishable in a single scan. Identify, for example, mineralogical differences within rocks and difficult-to-discern materials such as silicon and aluminum. Profit from side-by-side tuning of two distinct tomographies at different imaging and sample conditions. Collect data for dual energy analysis seamlessly and easily with DSCoVer.  

Gain better image quality in less scan time

Gain better image quality in less scan time

Gain better image quality in less scan time
Gain better image quality in less scan time:
64 Gb Flash Chip acquired using HART

High-Aspect Ratio Tomography (HART)

Achieve up to 2x higher throughput or better image quality when imaging flat samples such as semiconductor packages and boards. HART enables you to space variable projections so that you collect fewer projections along the broad side of a flat sample and more along the thin side. 3D data is provided by these closely-spaced long views versus less densely-spaced short views.

The Automated Filter Changer offers 12 standard filters

The Automated Filter Changer offers 12 standard filters

The Automated Filter Changer offers 12 standard filters
The Automated Filter Changer offers 12 standard filters
With room for 12 more custom filters.

Automated Filter Changer (AFC)

Image challenging samples even easier now. Use AFC to complement your DSCoVer and profit from more flexibility for your in situ workflows. Tune your X-ray energy spectrum with source filters enabled by AFC that houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Select filters easily and record your selection within imaging recipes so filters may be changed without disrupting your work flow.

Flexibly Image Larger Samples

Flexibly Image Larger Samples

Flexibly Image Larger Samples
Flexibly Image Larger Samples:
Such as this 6 inch stereo speaker.

Wide Field Mode (WFM) & Vertical Stitching

Image large samples with an extended lateral field of view or use the standard field of view to achieve higher resolution in a single tomography with the help of WFM. Profit from a bigger lateral field of view: approximately twice as wide as in the standard mode and three times larger for a 3D volume. Using the standard field of view, WFM provides nearly twice the number of voxels. Combine WFM with the existing Vertical Stitching feature and subsequently image large samples that are both wider and taller than the standard field of view usually allows.

 

 

Accessories

Laboratory-based Diffraction Contrast (LabDCT)

Unlock crystallographic information in your lab. Achieve direct visualization of 3D crystallographic grain orientation in a non-destructive tomography environment with the LabDCT advanced imaging module powered with GrainMapper3D software by Xnovo Technology. Diffraction contrast tomography (DCT), previously available only at a limited number of synchrotron X-ray facilities, can become your routine tool for non-destructive 3D grain mapping.

Acquire and reconstruct crystallographic information from polycrystalline samples, such as metals and alloys. Combine grain orientation information with microstructural features observed in absorption or phase contrast tomography, e.g. cracks, porosity network, inclusions. Open new possibilities for the characterization of damage, deformation and growth mechanisms related to 3D materials science. Achieve enhanced understanding of the fundamental materials science behind these processes with microscopic imaging features in three dimensions.

Flat Panel Extension (FPX)

FPX let you rapidly scout your sample and zoom to regions of interest at high resolution

FPX let you rapidly scout your sample and zoom to regions of interest at high resolution

Image even larger samples with high throughput at ZEISS best-in-class image quality. Enhance imaging flexibility and create workflow efficiencies with FPX for industrial and academic research. Rapidly scout large samples to identify a region of interest (ROI). Zoom to image targeted volumes at high resolution. FPX extends the Scout-and-Zoom workflow of Xradia520 Versa. Image the full field of view of samples beyond a 5 inch diameter, like geological cores or intact smartphones, with higher throughput. Combine FPX with Resolution at a Distance (RaaD) and benefit further from high resolution imaging for a variety of samples.

AUTOLOADER

Autoloader option enables you to program up to 14 samples at a time to run sequentially

Autoloader option enables you to program up to 14 samples at a time to run sequentially

Autoloader option enables you to program up to 14 samples at a time to run sequentially
Autoloader option enables you to program up to 14 samples at a time to run sequentially

Increase your sample handling efficiency: with the Autoloader you can set-up queues of imaging jobs across a shift or over a weekend. Receive automatic notification of job completion. Achieve precise and repeatable sample measurements. Benefit from flexibly handling diverse sample types in the same queue. Minimize user interaction in you research or industrial laboratory, industrial process development, service laboratory, or university central imaging laboratory.

Software

Use Our Super Simple Control System to Create Efficient Workflows

All of the features introduced by the Xradia 520 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are well-regarded, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.

 

New on Version 11:

  • Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller.
  • New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards.
  • Adaptive Motion Compensation is a new method to compensate for sample drift that may during the course of a tomography, such as with soft samples.
  • The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction.
  • Incorporate color palette and log scaling for better data visualization using the new Enhanced Histogram capability.
  • Dual Scan Contrast Visualizer, DSCoVer, on Xradia 520 Versa has been updated with our newly patented dual energy interface to give you precise segmentation of different material types, or different materials with similar densities, with the improved dual energy interface.
     
Visualization and Analysis Software

Visualization and Analysis Software

ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

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Applications

Downloads

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