Forensic Science

ZEISS EVO Scanning Electron Microscope
Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) are well established techniques for the classification of gunshot residue (GSR) in forensic examinations. Since the 1980s, the composition of many ammunitions has changed. Heavy metals have been avoided in order to comply with environmental standards, and stabilizers and plasticizers have been added during the manufacturing process for safety reasons. Thus, it has become more difficult to classify the GSR particles. EDS analysis allows the identification of particles and classification of their characteristic chemical composition. Consequently, common GSR elements such as lead, antimony and barium can easily be detected. Whether you use adhesive stubs, tape or filter paper EVO, conventional SEM offers flexibility for any sample type. You can reliably detect GSR particles of ≥ 0.5 µm in size.

Modular SEM Platform for Intuitive Operation

ZEISS Sigma Scanning Electron Microscope
Sigma is your field emission SEM for high quality imaging and advanced analytical microscopy. The Gemini objective lens design combines electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. Sigma’s best-in-class EDS geometry increases your analytical productivity, especially on beam sensitive samples. The short analytical working distance of 8.5 mm and a take-off angle of 35°allows you to obtain analytical data at half of the default probe currents and at twice the speed. The high stability of the Sigma column provides the means for fast and complete X-ray analysis and mapping. This is due to the fact that placing the detectors closer to the sample facilitates achieving complete shadow-free analytical results. a. With Sigma you can reliably detect particles < 0.5 µm in size and distinguish them from the environmental particles.

High Quality Imaging and Advanced Analytical Microscopy

ZEISS Axio Zoom.V16
Axio Zoom.V16 is your motorized fluorescence zoom microscope. You profit from a 16x zoom in combination with a high numerical aperture of NA 0.25. This zoom microscope achieves a very high numerical aperture in the medium zoom range already: you get superior fluorescence brightness in large object fields. In addition to brightfield, darkfield and oblique illumination, you get an increased contrast brightfield at the touch of a button. With the Best Mode button, the stereo zoom microscope Axio Zoom.V16 determines the actual optical state and optimizes transmitted light automatically. Save your setting and reload it for your next investigation of trace evidence. You always get reproducible, comparable results.

High Quality Imaging and Advanced Analytical Microscopy

ZEISS Axio Imager 2 for Polarized Light
Axio Imager 2 allows a wide range of applications for forensic analysis and examinations, e.g. failure analysis, gunshot residue, fiber or paint analysis. With the motorized reflector turret, for six or ten Push & Click filter modules, you can easily work with all the different contrast methods in transmitted or reflected light. The pre-centered Bertrand optics allows you to switch easily between orthoscopic and conoscopic observation. Due to the motorization and the automated component recognition (ACR) you can rely on your microscope settings at all times. Save your individual settings and retrieve them effortlessly with a push of a button. Due to the ability to use additional correlative microscopy you can transfer your samples to a ZEISS electron microscope for further investigations.

Perform Complex Tasks Reliably