Events Semiconductor Manufacturing Technology

IPFA 2020 Int'l Symposium on the Physical & Failure Analysis of Integrated Circuits


07/20/2020 - 07/23/2020


China / Hangzhou


IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device / circuit / module failure that serves as critical input for future design for reliability.