Crossbeam FIB-SEM Family

High throughput 3D analysis and sample preparation

ZEISS Crossbeam FIB-SEM Family

The ZEISS Crossbeam family combines the powerful imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) column with the superior processing ability of a next-generation focused ion beam (FIB) tailored for your specific application.

NEW - Crossbeam Laser FIB-SEM

The new ZEISS Crossbeam laser FIB-SEM is a site-specific cross-section solution enabling faster package failure analysis and process optimization. Integrating a femtosecond laser for speed, a Ga+ beam for accuracy and SEM for nanoscale-resolution imaging, Crossbeam laser FIB-SEM provides package engineers and failure analysts with the fastest cross-section solution at the highest imaging performance, while providing minimal sample damage. 



Crossbeam FIB-SEM

Combine imaging, milling and analytical performance of next-generation FIB-SEM for nanoscale tomography and sample preparation with Crossbeam 350/550. The modular platform concept and the open, easily extendable software architecture of this 3D nano-workstation enables high throughput for process control, structural inspection and failure analysis.