Session 1: The Standard Protocol Report, How to Set Up Characteristic Attributes, and Running a Type-1 GR&R
Thursday, March 13, 1:00 - 2:00 PM CT

We’ll kick the series off by answering three of the most common ZEISS PiWeb questions from our ZEISS community. For our newer ZEISS PiWeb users, we'll start with "Everything You Didn't Know About the Standard Protocol Report." For our advanced users, we'll show how to filter critical characteristics by setting up custom characteristic attributes, for both ZEISS PiWeb Reporting Plus and ZEISS PiWeb Enterprise environments. Last, we'll show you how to set up a Gage R&R Type-1 study in CALYPSO and how to read the Type-1 PiWeb report.

Session 2: Type 2 GR&R, Applying Measurement Selection for practical use, plus utilizing sorting and filters to solve a production issue
Thursday, April 10, 1:00 - 2:00 PM CT

Our journey continues with a look at the Gage R&R tool and a type 2 study. Get a quick overview of measurement selection, one of the most common tools in ZEISS PiWeb Monitor reports. Learn to utilize various options to organize data in different views for a particular use case scenario. We will conclude with the use of sorting and filtering options to answer an end-user question and explain how to approach a production possible issue.

Session 3: Latest enhancements in ZEISS PiWeb 2025
Thursday, May 8, 1:00 - 2:00 PM CT

Dive into the latest enhancements of ZEISS PiWeb! Discover 2025 software updates designed to streamline your quality data.
Get an expert overview of:
• New Web Licensing Interface – Discover how the improved licensing system simplifies management, handling, and deployment of licenses to your user based
• Web Report Management – Learn how to organize, distribute, and manage reports efficiently using the server web-based repository for your templates
• Web Monitor Interface – Explore the enhanced web Monitor interface capabilities for more flexibility and compatibility performing data visualization

Session 4: SPC general concepts, how to configure statistics-related graphics, and deep dive into the statistical templates
Thursday, June 26, 1:00 - 2:00 PM CT

Explore fundamental concepts of Statistical Process Control (SPC) and their integration within ZEISS PiWeb. Examine the configuration of various statistics-related graphics and customization options through different settings. Finally, we will conduct an in-depth analysis of one of ZEISS PiWeb’s statistical templates to enhance your understanding and improve your processes with visual tools.