advanced microscopy techniques

New Frontiers in Nanomaterials

Unlock the Secrets of Nanoscale Materials with Precision and Clarity

Empowering Nanomaterials Research With the rapid advancements in microscopy techniques, you now have access to an array of innovative tools designed to enhance nanoscale visualization and overcome previous limitations. Whether you're grappling with complex structures or seeking finer details, cutting-edge imaging technologies are paving the way for clearer insights and groundbreaking discoveries. Embrace these advancements with confidence, knowing that the path to unlocking the mysteries of the nanoscale is filled with opportunities for exploration and innovation. Your dedication to pushing the boundaries of knowledge is supported by a wealth of resources and techniques that can elevate your research to new heights.

Unparalleled Imaging

Image and characterize almost any material with nanometer resolution and enhanced signal.
High Precision Nanofabrication

Prepare nanostructured devices with the stability, automation, and ease-of-use for your nanopatterned structures.
Effortless Sample Preparation

Prepare samples for TEM or APT analysis using powerful automation and end-point control.

Drive Innovation with Exceptional Nanoscale Results

See the tools and methods used for breakthroughs in nanostructured materials

Fundamental Material Physics

Create precise nanometer-scale objects easily and reliably using in-column deceleration combined with electromagnetic and electrostatic lens technology for material innovations in fields such as photonics, optoelectronics, plasmonics, and quantum technology.

ZEISS GeminiSEM

Image Delicate Materials

Image your samples in their native state without sacrificing image quality or resolution. Utilize the power of in-column beam deceleration and C-DIC technology to image the most beam-sensitive materials.

ZEISS GeminiSEM

Prototyping Next-Gen Nanostructures

Gain the precision and advanced patterning capabilities needed for prototyping advanced devices for innovations in areas such as medicine, communications, and more.

ZEISS Crossbeam

Investigating Thin Film Properties

Prepare samples for further investigation in TEM with powerful automation and unparalleled precision and efficiency.

ZEISS Crossbeam Samplefab

Studying Micromechanics

Prepare samples with ease, precision and speed for micromechanical testing with automated fs-laser milling.

ZEISS Crossbeam

Aging Studies in SOECs

Gain deeper insights into the resistance of solid oxide electrolysis cells (SOEC) to thermal cycling and their improved lifetime through high-resolution 3D analysis.

ZEISS Crossbeam

What You Can Do

<10 nm

Patterning capability with the ZEISS Crossbeam
Full 200 mm

Sample size capability without the need to rotate your sample on ZEISS Crossbeam and Gemini SEMs
>60 hours

Constant FIB beam current for long milling operations on the ZEISS Crossbeam
4nm

Isotropic voxels with Atlas 5 for the highest resolution 3D FIB tomography
33 mins

to prepare a pillar for APT or for micromechanical testing with ZEISS Laser FIB

Recommended Products for Nanomaterials

For the Highest Demands in Electron Imaging
ZEISS GeminiSEM

Effortlessly capture stunning journal cover micrographs with the ZEISS GeminiSEM. Boasting over 30 years of innovative advancements in in-column deceleration and magnetic-free lenses, the GeminiSEM delivers sub-nanometer resolution while ensuring the great flexibility in sample selection.

Explore GeminiSEM

Choose GeminiSEM if you need:
Capture high-quality, high signal-to-noise images at <100 eV.

Up to 13 mm wide FOV for ultra-low magnification images.

Choose from the widest selection of detectors and in situ systems to tackle any imaging need.
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Elevate Your Control and Maximize You Insights
ZEISS Atlas 5

Atlas 5 enables the creation of detailed multi-scale, multi-modal images within a sample-centric correlative environment. This powerful yet user-friendly system enhances the capabilities of ZEISS SEM and FIB-SEM instruments. It allows efficient navigation and correlation of images from various sources, including light and X-ray microscopes. With its modular design, Atlas 5 can be customized to meet specific requirements in materials or life sciences research, such as nanopatterning or 3D tomography, providing a versatile tool for comprehensive analysis.

Explore Atlas 5

Choose Atlas 5 if you need:
Perform large area imaging (up to 40k x 50k pixels) with ZEISS SEM, FE-SEM & FIB-SEM.

Achieve precision in z when running a 3D Tomography with Thin & Fast Tomography and True-Z.

Benefit form simultaneous beam control with full patterning and imaging support for ion and electron beams.
Learn more
High Throughput 3D Analysis and Sample Preparation
ZEISS Crossbeam

The ZEISS Crossbeam combines qualities you’ve come to expect in your FIB with others you haven’t—features like 8 inch wafer capability, multiple day beam stability, and unparalleled automated TEM lamella preparation with end-point control—all integrated into a fully automated and user-friendly platform.

Explore Crossbeam

Choose Crossbeam if you need:
Maximize your applications without minimizing quality with the flexibility of the Ion-sculptor column.

New easy-to-use and easy-to-learn user interfaces for advanced and novice users.

Industry leading 3D resolution and advanced patterning.
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Get to know more products

ZEISS Research Essentials

Greenough Stereo Microscope with 8:1 Zoom
ZEISS Stemi 508

With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.

Trial, get a Quote or Purchase here
Materials Microscope for Routine Materialography and Smart Documentation
ZEISS Axiolab 5

ZEISS Axiolab 5 is the right choice if your routine materialography applications place high demands on ergonomic operation and efficient digital documentation.

Trial, get a Quote or Purchase here
Microscope for Research and Routine in the Materials Lab
ZEISS Axioscope

The right choice if your routine inspection tasks place high demands on usability, reproducibility and automation – and you also need advanced optical microscopy for materials analysis and metallography.

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Complete your lab

with our new solution bundles

You can enhance your Nanoscience & Functional Materials Research with the following solutions

Configure your Stemi 508

ZEISS offers a variety of microscopy techniques for nanoscience research, including:

Field Emission SEM: Characterization is fundamental to materials science research, making ultra-high resolution electron microscopy crucial for understanding the structure and morphology that determine material properties.
Focused Ion Beam SEM: Whether you're fabricating nanodevices to study superconducting nanowires or preparing TEM lamella for thin film analysis of CIGS and perovskite materials for next-generation solar cells, a FIB-SEM is essential for manipulating and fabricating materials at the nanometer scale.
Advanced Patterning Software: Enhances your process with simultaneous beam control for both ion and electron beams, smart operation recipes for consistent milling and deposition, optimized experiment design using 3D profiles and array builder tools and save up to 40% milling time with Fastmill for efficient FIB cross-section preparation.
ZEN Core EM: Standardize imaging workflows on ZEISS microscopes, from SEMs and FIB-SEMs to light microscopes, with an intuitive, consistent, and customizable user interfaces that allow you to focus on your science rather than being a microscopist.

These techniques form a solid foundation for nanoscience research and will deliver the results you need to keep your research moving forward.
ZEISS microscopy solutions enable nanomaterials research by offering:

Sample Versatility: ZEISS microscopy solutions offer a broad spectrum of light, electron, and FIB microscopes, providing flexibility to analyze diverse nanomaterials and structures with precision and adaptability.
High-Precision Sample Preparation: The ZEISS Crossbeam dual FIB enables meticulous sample preparation for TEM lamella and nanomachining, ensuring high-quality results for detailed nanofabrication research.
AI-based Image Analysis: ZEISS software utilizes AI-based models to streamline complex image analyses, facilitating automated segmentation, feature extraction, and quantitative measurements for insightful data interpretation.
Connected Imaging: Seamless integration of imaging data from light, electron, and FIB microscopy, along with third-party datasets, provides comprehensive characterization of nanomaterials at multiple scales, enhancing the depth and breadth of nanoscience research.

Together, these solutions enable you to unlock new insights and push the boundaries of neuroscience research.
ZEISS technology is used everyday to advance research in nanomaterials and nanofabricated devcies. Here are a few examples:

Fabrication of Nanofluidic Devices: Direct FIB nanopatterning on silicon master stamps facilitates quick prototyping of nanochannels in diverse shapes, cross-sections, and depths.
ZEISS Solutions for Micro- and Nanofluidics
CIGS Solar Cells: FIB cross sections of SIGS solar cells on different substrates reveal the internal structure of the cell and for subsequent analysis using STEM, EDS, and SIMS.
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Microstructural Analysis of Battery Cathodes: Machine learning-based segmentation methods provide a more accurate segmentation results as compared to classic thresholding.
Quantitative Microstructural Analysis of State-of-the-art Lithium-ion Battery Cathodes

These are just a few examples—explore our website to discover more resources tailored to your nanomaterials research needs.

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New Frontiers in Nanomaterials

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