ZEISS at Microscopy & Microanalysis (M&M) 2026

Booth #929

At Microscopy & Microanalysis 2026 in Milwaukee, booth #929, discover how the latest microscopy solutions can help you accelerate innovation in materials research and industrial development. Join us to explore advances in light, electron, and X-ray microscopy, AI-powered software, and application-driven workflows designed for materials engineering, manufacturing, quality assurance, and failure analysis.

Experience focused presentations and hands-on tutorials on automated metrology, in situ experimentation, AI-driven reconstruction with DeepRecon Pro, and the newest imaging and analytics technologies. Take part in live demonstrations and interactive workflows led by our application experts, and see how solutions like ZEN Core for multi-instrument facilities and Predictive Service can streamline your processes, increase throughput, and improve data reliability.

More than a chance to see new tools, this is an opportunity to connect with peers, exchange ideas, and uncover new ways to turn complex materials challenges into competitive advantages. Visit us at booth #929 and let’s advance the future of materials together in 2026 and beyond.

Courtesy of Allen Gu/Brenda Ropoulos

ZEISS Microscopy as a Service

Accelerate failure analysis in advanced semiconductor packages with expert-led microscopy services.

From nanoscale defect characterization and failure analysis to 3D structural reconstruction and materials verification, our experts deliver high-resolution, data-rich insights that support process optimization, yield improvement, and next-generation device development. Flexible project models and scalable capacity ensure you can move quickly from root-cause analysis to confident decision-making.

Connect with ZEISS for In-Booth Educational Presentations

Join us for lunch & learning opportunities from industry experts.
  • Abstract

    Three-dimensional imaging of micro- and nano-structures by X-ray microscopy (XRM / microCT) has become a critical technique in materials research, biological science, geoscience, and failure analysis labs. This talk will present the latest XRM technology and product developments from ZEISS, spanning innovations in hardware (X-ray sources, detectors, rapid scanning strategies…) as well as software (intuitive instrument control, deep learning-based reconstruction, compositional analysis,..). Taken together, these technology developments will be shown to push the boundaries of the technique in terms of imaging resolution, acquisition speed, data clarity, and broad user accessibility.

     

  • Abstract

    Continued miniaturization of semiconductor devices and need for characterizing smaller features in various materials research disciplines place unprecedented demands on preparing TEM lamella, ET and APT samples, and precise cross-sectioning. The workflow to achieve damage-free samples the first time with precise endpoint control has become increasingly challenging as we dive deeper into more complex and beam-sensitive artifacts. Join us for this presentation to learn how ZEISS is addressing these workflow challenges through recent advances in focused ion beam–scanning electron microscope (FIB‑SEM) instrumentation.

  • Abstract

    Compared to traditional operation, microscopy automation offers the potential for both improved productivity and result repeatability. This talk will demonstrate two new tools for automation of the materials microscopy lab:

    1. ZEISS Blockwise is an innovative and intuitive new software platform designed to automate electron microscope (EM) control, image analysis, and metrology. Tailored for R&D, failure analysis, and QA/QC labs, this no-code platform integrates a drag-and-drop workflow builder, seamless integration with hardware, and advanced image analysis tools. We’ll show how the low-code environment simplifies complex tasks while still offering flexibility for advanced users through Python scripting.
    2. ZEISS X-ray microscopes offer a robust Python API for building advanced and customized user operation. In this talk, a demonstration of such a case will be presented in which a framework of Large Language Model (LLM) agents have been deployed to control the XRM by interpreting natural language user instructions, dictating Python API commands to the microscope, and performing automated processing and analysis of resulting 2D/3D image data. This architecture lays a foundation for myriad automated 3D imaging workflows, without the requirement for manual and time-consuming user coding.

Live Microscopy Demos at M&M

Connect directly to our ZEISS Microscopy Customer Center.

Connect with Our Microscopy Experts

ZEISS Microscopy applications specialists will be available live in the M&M exhibit hall to provide on-demand product demonstrations and help answer your technical questions. Via remote connection to our lab in Dublin, California, you can experience the latest capabilities, new user interfaces, and tailored workflows. We welcome you to stop by to enjoy a hands-on session with:

  • ZEISS EVO Scanning Electron Microscope - featuring SmartPI automated particle analysis software
  • ZEISS Sigma Field Emission SEM – excellent for flexible multi-user labs, analytics, and multiscale correlative imaging projects
  • ZEISS GeminiSEM Field Emission SEM – the ideal choice for high resolution imaging needs and advanced automated workflows
  • ZEISS Crossbeam 750 – the latest addition to the ZEISS Crossbeam family, offering the highest quality “see while you mill” capability for ultimate precision in sample preparation
  • ZEISS VersaXRM – providing sub-micron scale, nondestructive 3D X-ray imaging to reveal internal microstructures with clarity, speed, and an intuitive user experience

Microscopy Outreach

X93: Cultivating STEM Networks - A Workshop for Local Leaders, Students, and Educators

We are excited to be partnering with Discovery World and the MSA Education Outreach Committee this year at M&M to host a two-day workshop focused on providing hands-on STEM learning for middle and high school students, using microscopy to build interest in STEM fields. Registration for this event is required, please visit the link below to register.