Monthly Microscopy Webinars

Join us for educational presentations from our experts, researchers from your field and trusted customers to learn how ZEISS can help you advance your research.

This Month's Featured Webinar

TEM Lamella Preparation for Semiconductor Samples - FIB Techniques and Advancements

TEM sample preparation is a key application of FIB-SEM instruments. Recent FIB lamella preparation advancements include integrated fs-lasers and automation to boost productivity. Join us to explore the latest innovations from ZEISS Microscopy and expand your understanding of these technologies.

Upcoming Microscopy Webinars

January 23	Advancing Tau-opathy Research in PSP through High-Throughput and Predictive Analytics with Dr. Rose B. Creed	Registration Closed \| On-Demand Recording Available
February 27	Revolutionizing Plant Biology: Exploring X-ray Microscopy for 3D Imaging in Plant Biology and Agricultural Innovation	Registration Closed \| On-Demand Recording Available
March 20	TEM Lamella Preparation for Semiconductor Samples - FIB Techniques and Advancements	Virtual
March 27	Lead in Battery Material Research: How Advanced Microscopy Drives Industrial Battery Innovation	Virtual
April 1st, April 3rd, April 7th & April 9th	New Microscopy Techniques For Studying Microstructures of Metals & Alloys	Virtual
April 24th	Cell Biology \| Details To Come	Virtual
Late May	Education & Routine \| Details to Come	Virtual
June 26	Cancer Research \| Details to Come	Virtual
July 23	BrAInsights Breakthrough \| Details To Come	Virtual