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How ZEISS O‑INSPECT Combines Optical and CMM Inspection for Faster Quality Control
September 10, 2026 | 10 AM PT | 1 PM ET
Manufacturers are increasingly tasked with inspecting complex parts that contain features requiring different measurement approaches. Traditional inspection workflows often involve multiple systems, additional setups and increased complexity.
ZEISS O‑INSPECT brings optical and tactile measurement technologies together in one multisensor platform, allowing users to select the most effective measurement strategy for each feature while maintaining a streamlined inspection workflow.
Join ZEISS experts for a live demonstration and learn how optical inspection, CMM inspection and multisensor metrology can work together to improve efficiency and support modern quality requirements.
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What You’ll Learn
In this webinar, you'll learn:
- The differences between optical inspection and CMM inspection
- When to use optical, tactile and non-contact measurement approaches
- How multisensor technology improves quality inspection workflows
- Strategies for measuring more parts and more features with one system
- Real-world ZEISS O‑INSPECT applications
- How ZEISS CALYPSO supports multisensor measurement workflows
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Who Should Attend
This webinar is ideal for:
- Quality engineers responsible for product inspection and quality assurance
- Manufacturing engineers seeking more efficient inspection workflows
- Metrology professionals evaluating multisensor measurement technologies
- Quality managers driving quality and process improvements
- Production engineers focused on inspection efficiency and throughput
- Anyone exploring optical inspection or CMM inspection solutions
Ready to improve your inspection workflow?
Discover how ZEISS O‑INSPECT combines optical and tactile measurement technologies to help manufacturers inspect more parts, verify more features and streamline quality control processes.