Scout-and-Scan Instrument Control System
Scout-and-Scan Instrument Control System
Easily target regions of interest and specify scanning parameters with the intuitive and easy-to-use Scout-and-Scan Control System for Xradia Versa/Context instruments.
Regular updates to Scout-and-Scan’s functionality are part of ZEISS X-ray Microscopy’s ‘Protect Your Investment’ strategy – a commitment to delivering innovation that extends the lifetime and productivity of instruments in the field with upgradable modules and new capabilities.
SmartShield Compatibility
SmartShield is a fully integrated hardware-software solution designed to create digital sample envelopes to assist the operator during the sample setup in their workflow. It is an automated protection system to help users confidently position their sample and instrument components for maximum efficiency and high-quality results.
With SmartShield installed on your instrument, Scout-and-Scan V16.0 provides benefits with:
- 3D awareness for sample and instrument safety
- Enhanced operator efficiency during sample setup
- Fully integrated with Scout-and-Scan V16.0 for fast model creation within 5 minutes
SmartShield is compatible, and field upgradable, on all Xradia 620/610/520/510 Versa and Xradia Context MicroCT platforms. Prerequisites include Windows 10 and Scout-and-Scan V16.0 or higher.
Sample Envelope Application Example
Downloads
ZEISS Predictive Service
ZEISS Smartshield Upgrade
Advanced Reconstruction Technologies
Not all products are available in every country. Use of products for medical diagnostic, therapeutic or treatment purposes may be limited by local regulations. Contact your local ZEISS provider for more information.