ZEISS at Microscopy & Microanalysis (M&M) 2023

Discover the Power of Possibilities Booth #519

Your research consumes your thoughts, queuing up questions on how you can see more, see deeper, capture the moment, and make a breakthrough. But what lies beyond your current systems and software capabilities? Discover new innovations to help make the data you seek, visible.

Leverage our experts to help you connect your needs to the right solution, the right training, and the right settings for repeatability.

As your partner, we are focused on sustainability, leveraging our digital efficiencies to fulfill your needs, wherever you are in your consideration process. We are your resource, your network for achieving your next breakthrough. We believe that you are the power behind what’s possible, let us help you find innovations to achieve your discoveries, faster.

This year, at M&M 2023, visit us in booth #519 to join us in bringing together sustainability and cutting-edge technology to display our latest product launch, debut new researcher discoveries on our interactive wall, show our products in a VR showroom, and offer live virtual product introductions.

Introducing ZEISS Volutome

In-Chamber Ultramicrotome for Serial Block-Face(SBF) SEM

ZEISS Volutome is an end-to-end solution from hardware to software including image processing, segmentation, and visualization. The ultramicrotome can be easily replaced by a conventional SEM stage, converting your 3D FE-SEM into a standard, multipurpose FE-SEM, making your system adaptable to a multi-purpose environment.

A simple solution for SBF SEM

  • Automated cutting, image acquisition, and pre-processing
  • Superb 3D imaging of biological samples
  • A complete ZEISS solution from hardware to software

Visit us in Booth #519 to learn more

Connect with ZEISS for In-Booth Educational Presentations

Each day has a chance to connect, be sure to add it into your schedule.

Tim Schubert Hochschule Aalen
Alice Liang and Aubrey Funke New York University Grossman School of Medicine and Carl Zeiss Microscopy
Keith Duncan Donald Danforth Plant Science Center
Joachim Mayer Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany


Monday 3:30pm

Tuesday 12pm

Tuesday 3pm

Wednesday 12pm


Extending FIB-SEM by fs-laser integration to address materials challenges for R&D, quality control and FA

Exploring the Power of Serial Block-Face Imaging: A Key Technology in the Volume EM Revolution

X-ray Microscopy: Bringing Multiscale 3D Volume Imaging to Plant Biology

The Role of Correlative CT and EM Investigations in the Development of Li ion Battery Technology


The increasing miniaturization and individualization of advanced materials and components, coupled with higher material purity and manufacturing quality, have made identifying and investigating failures more challenging yet critical in R&D as well as quality control and failure analysis. Precisely locating and preparing target areas deeply buried and sparsely distributed necessitates advanced techniques. While standard materialographic approaches combined with CT scans are commonly used, their targeting precision relies heavily on machine capabilities and the skill of the user. An alternative method involves correlative approaches that combine CT or X-Ray Microscopy with high-precision FIB preparation. Although this achieves high accuracy, the limited width and depth of FIB restrict it to near-surface features. To overcome these issues, an integrated system combining a femtosecond (fs-) laser with a standard FIB/SEM was introduced. The integrated system enables seamless transitions between various preparation modes, saving time and effort compared to using separate systems that require sample transfer and extensive alignment. The addition of a fs-laser widens the application space for sample preparation and manipulation from only 100 µm to the mm range. By the example of different advanced materials samples and components the talk will outline the benefits of utilizing an integrated system with regard to accuracy, time savings and knowledge generation in both R&D and quality control / failure analysis environments.

Life takes place in three dimensions. Scanning electron microscopy (SEM) offers opportunities to explore intricate, ultrastructural 3D information of tissues and cells with techniques that are known collectively as volume EM. Join Dr. Alice (Feng-Xia) Liang, a leader in the volume EM community, and Aubrey Funke, the life science electron microscopy product marketing manager from Carl Zeiss Microscopy, to discover for yourself why volume EM has been named a key technology to watch in 2023. See the ultrastructural imaging power of these techniques and how volume EM can spark inspiration in your own research. Explore varied life science applications with Dr. Liang and how she uses serial block-face imaging as a key technology in her microscopy core. Learn about the new volume EM solution from ZEISS. ZEISS Volutome is the next generation of serial block-face imaging: highly automated, fully integrated and optimized for volume data creation. Discover the features that save you time while allowing you to access large volume data with superb image quality at low kV.

Imaging in plant biology is a critical aspect of understanding growth and development, particularly for meristems and inflorescence structures. In addition, understanding the interaction of roots with soil is crucial, but it is difficult as these processes occur underground. Capturing detailed 3D image data of these delicate structures and complicated environments is difficult for conventional microscopy. X-ray microscopy (XRM) bridges this imaging gap by providing multiscale high-resolution 3D tomographic data where cell-level volumes can be situated within the context of the whole structure. XRM is a powerful tool for visualizing root-soil-microbe interactions in situ without having to dig up the root system. Correlative imaging is also significantly enhanced by using XRM of whole resin-embedded plant samples as a road map for nanometer-scale volume electron microscopy, avoiding the uncertainty of sectioning blindly through a sample. Use of XRM in the multiscale and multimodal analysis of 3D plant features using economically and scientifically important plant systems will be presented.

Batteries and related energy storage systems are one of the dominant factors in the global transition to renewable energy use. Here we report on investigations aiming at a scale-bridging and three-dimensional understanding of Li-ion battery electrodes and their functionalities. Therefore, we employ microCT and nanoCT investigations, which provide very valuable insight in battery structures and ageing mechanisms, in a complementary way to gain three-dimensional information on multiple length scales. In a correlative approach, these investigations are then combined with higher resolution electron microscopy characterization of the electrode microstructures, the anode and cathode materials and the surfaces and interfaces of a broad range of battery materials. The scale bridging results on materials and functionalities can be employed to design novel battery materials with improved storage capacities and to optimize the properties of the resulting concepts.

At the core of our activities, MicroCT and NanoCT were used to determine the three-dimensional microstructure of the electrode samples. The MicroCT images were collected on a ZEISS Xradia 520 Versa 3D X-ray Microscope, and NanoCT was performed on a ZEISS Xradia 810 Ultra 3D X-ray Microscope. The increased resolution of the 810 Ultra provides a very detailed picture of the active material, with microstructural details clearly resolved. Because of the lower x-ray energy used in the 810 Ultra, however, the sample geometries have to be limited to several tens of micrometers in diameter. The CT images of the new and the aged cell can be visually and analytically compared and offer valuable insights in the structural changes during the ageing process. Future activities will include novel approaches for correlative data management and AI-based analysis of the combined CT and EM results.

Live Microscopy Workflows at M&M

Connect Directly to our ZEISS Microscopy Customer Center. Find your workflow of interest, and fill the form below to request a spot during the demo.

Request your virtual workflow session

Thank you for your interest! Pre-registration is no longer available.  To request a workflow session at M&M, please stop by our reception desk at booth #519!

You can also request an in-person or virtual demo with the ZEISS Microscopy Customer Center at your convenience:

ZEISS Pre-Meeting Congress Talk

From Image to Results - Using AI and deep-learning to automate image acquisition, processing and analysis via an interconnected digital ecosystem by Ryan Jacobs, ZEISS

CATEGORY:  X63 — Imaging in the Pharmaceutical, Biopharmaceutical, and Medical Health Products Industry
TIME: July 23 10:30-11:15

ABSTRACT: In modern biotechnology and pharmaceutical research, achieving critical research milestones and the time it takes to do so, are of the utmost importance to bringing next-generation therapies to market. Thus, accelerating R&D timelines, acquiring multiplexed data sets, and automating complex workflows have become crucial for making scientific decisions faster. Advances in the realm of AI and deep learning promise to make all this possible, yet combining these capabilities with current research workflows seems elusive and difficult. In order to make these technologies practical and accessible, we need “de-mystify” AI to show its direct benefits with scientific imaging so we can yield tangible gains in sample throughput and data analysis. In this talk, we explore the transformative potential of AI and deep learning in automating image acquisition, processing, and analysis via an interconnected digital ecosystem created by ZEISS, including the discussion of real-world case studies. Because the goal is to allow companies and researchers to spend more time on what truly matters: the science and making informed decisions on quality, reproducible data.

Join our ZEISS Technical Presentations

Click on your talk of interest to see its format and location

  • Format: Presentation
    Location/Symposium: Session A02.1 – Microscopy and Microanalysis for Real World Problem Solving

  • Format: Poster
    Location: Exhibit Hall

  • Format: Poster
    Location: Exhibit Hall

  • Format: Presentation
    Location: Session P04.1 – Correlative Microanalysis of Rapid Solidification Microstructures in Additive Manufacturing

  • Format: Poster
    Location: Exhibit Hall

  • Format: Poster
    Location: Exhibit Hall

  • Format: Poster
    Location: Exhibit Hall


  • Format: Poster
    Location: Exhibit Hall

  • Format: Presentation
    Location: Session C03.7 – Correlative and Multimodal Microscopy and Analysis