ZEISS at 2020 MRS Spring/Fall Meeting & Exhibit
Find your next breakthrough

November 27 – December 4

One thing that remains consistent this year is finding ways to continue research in our ever-changing working environments.

ZEISS is your partner to help you find your next breakthrough and is delivering new innovations to support you. Spend some time and learn about what’s new in our virtual 360 immersive booth, register for one of our webinars, and even sign up for a live remote demo with our product experts.

Tour our virtual booth

Discover Solutions in Our On-demand Webinars

Hear about new insights, new technology, and find a solution to help you
find your next breakthrough.

Learn how electron microscopy innovations can be used to understand the electric, magnetic, and microstructural crystalline properties at the nanoscale as well as morphology, topography, and atomic/elemental contrast.

Imaging Magnetic Materials and Nanoparticles

Can a scanning electron microscope (SEM) image magnetic material? This is a commonly asked question, and there are legitimate concerns about putting magnetic samples in an SEM (e.g., magnetic distortion, damage to the final lens).

In this webinar, we will answer these questions in detail and introduce the advantages of the ZEISS Gemini column for imaging such materials. Through examples of several applications, we will highlight the optimal conditions and methods for imaging and performing analytics such as EDS and EBSD on demagnetized and magnetic samples and nanoparticles that will enable you to get the most out of your SEM. Finally, we will discuss a special contrast mechanism that enables imaging of magnetic domains using Type I magnetic contrast.

Key Learning Objectives

  • Understand the differences between immersion and field-free objectives and their influences in imaging magnetic materials.
  • Learn the optimal SEM conditions for imaging magnetized and demagnetized samples and nanoparticles at high resolution.
  • Investigate magnetic contrast using low-voltage SEM imaging.
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STEM Imaging and Tomography in a SEM

Transmission electron microscopy (TEM) is an imaging technique that provides atomic-level imaging and is typically reserved for TEM dedicated instruments. In this discussion, we will outline the contrast mechanisms in transmission imaging and highlight how STEM in FESEMs is becoming an increasingly adopted technique for a wide variety of applications ranging from imaging nanomaterials, thin sections of biological specimens, and diffraction studies and crystal orientation mapping at the nanoscale. The final part of this session will focus on 3D tomography enabled with a new STEM holder that allows the sample to be tilted and how digital image correlation techniques and 3D reconstruction can provide 3D volume imaging at the nanoscale.

Key Learning Objectives

  • Learn about transmission imaging signal contrasts in a FESEM.
  • Become familiar with tilt tomography in FESEM.
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Low-kV Scanning Electron Microscopy - Beyond Sample Topography

In recent years, advances in low-kV SEM imaging have resulted in new capabilities and applications. Improvements in spatial resolution supplement the advantages of low kV imaging, which include the ability to see surface information from both topography and material contrast perspectives, image nonconductive, and beam sensitive materials. In this discussion, Dr. Iwona Jóźwik will describe and explain the principles of low kV imaging and highlight various contrast mechanisms to study III–V semiconductors and electronic materials. The strong contrast mechanisms observed with the Gemini column provide the clear ability to distinguish dopant types (p or n type) and density variations in III–V semiconductor devices and quantum wells. Insights into identifying and understanding artifacts and damage from different sample preparation methods will also be presented.

Key Learning Objectives
  • Understand the advantages of low kV SEM for surface sensitive imaging.
  • Learn about contrast mechanisms with SE and BSE signals at low kV to differentiate various materials in heterostructures and study the dopant type and distribution.
  • Identify artifacts and damage from various sample preparation methods.
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MRS Exhibitor Workshop

Tuesday, December 1 | 11:15 am – 11:30 am

The Next Chapter in Sub-nanometer Electron Microscopy for Materials Science

Speaker: William Harris

ZEISS is pleased to introduce to the MRS community the market introduction of the new GeminiSEM family of sub-nanometer, low-kV field emission scanning electron microscopes.
 

Connect with Product Experts in Live Demonstrations

Our experts are in the lab and ready to give you a virtual personalized demonstration. Fill out a form, select your product interest, and a team member will be in touch to schedule your live online demo.

We can work together to find your next breakthrough.