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Carl Zeiss Microscopy

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News Blog

News | 2015-07-31 09:55:56 |

Diffraction Contrast Tomography for 3D Materials Science Now in the Scientist’s Lab

The development of new materials needed in frontiering fields such as metals for additive manufacturing, alloys for bioengineering, or the high-strength-to-weight materials required by aerospace and a ...

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News | 2015-07-29 10:50:45 |

1965 – 2015: 50 Years of Excellence in Electron Microscopy

ZEISS proudly celebrates the 50th anniversary of commercial scanning electron microscopy (SEM). In 1965 the first commercial SEM was built by the Cambridge Instrument Company, a UK based predecessor c ...

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News | 2015-07-27 12:54:52 |

New ZEISS Technology Note: The Airyscan Detector

 July 27 marks the birthday of Sir George Biddell Airy, the famous British mathematician and astronomer. Among other accomplishments he was the first to write a full theoretical treatment in 1835 ...

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Events

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Intermediate & Advanced Level Workshop

June 15 - 26, 2015 - Manitoba, Canada

ZEISS Microscopy Labs & Education

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ZEISS EVO SEM Series Workshop

June 16 - 18, 2015 - USA / Thornwood, New York
October 6 - 8, 2015 - USA / Thornwood, New York

ZEISS FE-SEM Series Workshop

October 6 - 7, 2015 - USA / Thornwood, New York

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