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Industrial Quality Solutions

Microscopy built for industrial inspection and real world parts

ZEISS brings proven optical and electron‑beam innovation to help you inspect parts, surfaces, and materials with accuracy and repeatability.

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Axio Zoom.V16

High‑resolution imaging for large parts.

Axio Zoom.V16 combines a large field of view with high numerical aperture so you can inspect full components and filters while maintaining fine detail. Fewer tiles mean faster cleanliness checks, defect reviews, and inclusion analysis.

  • Best For:

    • Large parts
    • Filters & particle‑rich samples
    • Cleanliness checks
    • Wide‑field defect scanning

  • Key Strengths:

    • Large field of view
    • High NA for fine details
    • Fewer tiles → faster analysis
    • Great for optical inspection of big components

  • When to choose this system:

    You need fast, wide‑area optical clarity with enough resolution to see fine features.

Applications

  • Image courtesy of Aalen University​

    Inspection Control of Coalbrush​
    Image courtesy of Aalen University​

    Inspection Control of Coalbrush​

  • Detail of Lithium Ion Battery​

    Detail of Lithium Ion Battery​

  • Wafer 112x​

    Wafer 112x​

Download the Brochure

  • Preview image of Axio Zoom.V16 for Materials

    Axio Zoom.V16 for Materials

    High Resolution and High Speed: Your Zoom Microscope for Large Fields.

    14 MB
    Download

Axiovert 7

Fast, consistent imaging for repeatable workflows.

Axiovert 7 brings Smart Microscopy and encoded components to materials inspection. Smart Microscopy streamlines routine imaging by automatically applying key settings such as illumination and scaling, so users can capture accurate, well‑documented images with a single snap. Combined with motorized Z and guided workflows, it accelerates metallography, NMI, weld evaluation, grain structure analysis, and other routine tasks.

  • Best For:

    • Metallography
    • Weld inspection
    • Grain structure imaging
    • Routine materials lab tasks

  • Key Strengths:

    • Encoded settings for repeatability
    • Smart Microscopy workflows
    • Motorized Z
    • Stable inverted configuration for flat samples

  • When to choose this system:

    You need consistent, repeatable imaging for materials labs and routine inspection.

Applications

  • Hardness crack C60 Steel, brightfield, EC Epiplan 20×/0.4

    Hardness crack C60 Steel, brightfield, EC Epiplan 20×/0.4

  • Aluminum anodized, Polarization Contrast, EC Epiplan-Neofluar 5×/0.13

    Aluminum anodized, Polarization Contrast, EC Epiplan-Neofluar 5×/0.13

  • Carbon fiber reinforced polymer, EC Epiplan 20×/0.4

Download the Brochure

  • Preview image of ZEISS Axiovert System

    ZEISS Axiovert System

    Your Inverted Microscope System for the Materials Lab and Smart Documentation

    9 MB
    Download

EVO

Modular imaging for demanding inspection.

EVO offers modular chambers, detectors, and imaging modes to support industrial inspection and failure analysis. It reveals fractures, coatings, inclusions, contamination, corrosion, and complex surfaces. Variable‑pressure capability enables inspection of non‑conductive samples without coating.

  • Best For:

    • Fractures
    • Coatings & corrosion
    • Compositional analysis
    • Non‑conductive samples (with VP mode)

  • Key Strengths:

    • Modular detectors & chambers
    • High‑resolution surface detail
    • VP imaging → no coating needed
    • Reveals features optical systems cannot

  • When to choose this system:

    You need detailed surface or failure analysis beyond what optical microscopes can reveal.

Applications

  • Image courtesy of Aalen University​

    Debris and contamination are evident on the surface of an integrated circuit. Imaged with the SE detector in high vacuum at 10 kV.
    Image courtesy of Aalen University​

    Debris and contamination are evident on the surface of an integrated circuit. Imaged with the SE detector in high vacuum at 10 kV.

  • Cross section of galvanized mild steel, imaged using the SE detector on ZEISS EVO 15. Left: mounting resin; middle: zinc layer; right: mild steel.

    Cross section of galvanized mild steel, imaged using the SE detector on ZEISS EVO 15. Left: mounting resin; middle: zinc layer; right: mild steel.

  • Surface of the ball bearing imaged with the BSE detector reveals cracking and flaking of the surface structure.

    Surface of the ball bearing imaged with the BSE detector reveals cracking and flaking of the surface structure.

Download the Brochure

  • Preview image of ZEISS EVO

    ZEISS EVO

    Your Configurable SEM Solution for Surface, Defect, and Compositional Analysis

    12 MB
    Download

With the ZEISS EVO, we find the needle in the haystack.

Johannes Bachmann, is the expert for material analysis at INNIO Group. ​Download the flyer and read the full story.

Finding the needle in the haystack.​

Technical Cleanliness: INNIO Group analyzes the chemical composition of residual dirt particles using a ZEISS solution.​

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Accurate, reliable results are important, of course, but so is getting them quickly,

says Thomas Schaupp, laboratory manager at the accredited materials laboratory SPC. Find out how ZEISS EVO and correlative microscopy from ZEISS help the testing laboratory achieve 30% faster results.​ Download the flyer and read the full story.

Consult with a ZEISS expert to identify the best solution for your inspection workflow.

Tell us about your samples, workflows, and inspection challenges. Our team will help you identify the right system configuration and guide you toward the results you need.

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