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Materials Discovery with Field-Emission SEM
Virtual Workshops
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A multi-part workshop series providing insights into new discoveries in materials research. It is virtual and accessible from anywhere. This is part of our commitment to bring our expertise and application laboratory to you in an environmentally sustainable way.
Register for the next series or watch the recorded replays of workshops relevant to your research.
Workshop Agenda
Each interactive virtual workshop in the series will have presentations from ZEISS experts, key opinion leaders and live demonstrations from our application lab.
Event 1: Discoveries at “low-kV”
Lately surface-sensitive imaging has become an important topic of discussion in electron microscopy. It is very important to understand when and why we need to image surfaces at low beam energy without compromising resolution, how to achieve that in an easy repeatable manner, and know about a few key examples.
The why, how and what of low-kV scanning electron microscopy
Low Voltage SEM Imaging for Micro/Nanoelectronics Process Development and Troubleshooting
Live virtual demonstration: Sample flexibility and state-of-the-art imaging at low-kV using ZEISS FE-SEM
Event 2: Discoveries with Versatile Multi-Modal Analytics
Field emission SEMs are great imaging tools. However, most of the times our measurement workflow requires correlation with reliable quantitative analytics for chemical and microstructural characterization. Let us discuss how a FESEM can enable such multi-modal analytics with a few key examples.
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