Materials Discovery with Field-Emission SEM

Quarterly Virtual Workshops

Join us in this virtual workshop series where we will try to address the obvious questions, showcase the state-of-the-art imaging and analytical capabilities and open the discussion with you about your new material discovery using field-emission scanning electron microscopes.
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A multi-part workshop series providing insights into new discoveries in materials research. It is virtual and accessible from anywhere. This is part of our commitment to bring our expertise and application laboratory to you in an environmentally sustainable way.

Register for the series and join any or all of the workshops relevant to your research.  

Rubric

Workshop Agenda

Each interactive virtual workshop in the series will have presentations from ZEISS experts, key opinion leaders and live demonstrations from our application lab.  

Event 1: Discoveries at “low-kV” February 7, 2023, 02:00 PM – 04:00 PM EST

Lately surface-sensitive imaging has become an important topic of discussion in electron microscopy. It is very important to understand when and why we need to image surfaces at low beam energy without compromising resolution, how to achieve that in an easy repeatable manner, and know about a few key examples.

  • The why, how and what of low-kV scanning electron microscopy

  • Low Voltage SEM Imaging for Micro/Nanoelectronics Process Development and Troubleshooting

  • Live virtual demonstration: Sample flexibility and state-of-the-art imaging at low-kV using ZEISS FE-SEM

Event 2: Discoveries with Versatile Multi-Modal Analytics (coming soon)

Event 3: Multi-Scale Discoveries: Correlative Microscopy (Coming Soon)

Event 4: Multi-Scale Discoveries: Large Area Scanning and Automation (Coming Soon)

Learn About The Virtual Demo Process

Experience real-time measurements on actual samples through an enriched virtual demo process, while supporting our commitment to environmental sustainability.

Featured Products

FE-SEMs For Highest Demands

Sub-nanometer Imaging, Analytics and Sample Flexibility